公开(公告)号：US20240127431A1

公开(公告)日：2024-04-18

申请号：US18273106

申请日：2022-03-30

Applicant: Lunit Inc.

Inventor： Sunggyun PARK ,  Kihwan MIM ,  Seungwook PAEK ,  Donggeun YOO

IPC: G06T7/00 ,  G16H30/20 ,  G16H30/40 ,  G16H50/20

CPC classification number: G06T7/0012 ,  G16H30/20 ,  G16H30/40 ,  G16H50/20 ,  G06T2207/10116 ,  G06T2207/30068 ,  G06T2207/30096

Abstract: A computing apparatus operated by at least one processor includes a target artificial intelligence model configured to learn at least one task, and perform a task for an input medical image to output a target result, and a confidence prediction model configured to obtain at least one impact factor that affects the target result based on the input medical image, and estimate confidence information for the target result based on the impact factor.

公开(公告)号：US20230200740A1

公开(公告)日：2023-06-29

申请号：US18177266

申请日：2023-03-02

Applicant: LUNIT INC.

Inventor： Donggeun YOO ,  Sanghyup LEE ,  Minchul KIM ,  Hanjun LEE ,  Sunggyun PARK

IPC: A61B5/00 ,  A61B6/00

CPC classification number: A61B5/7264 ,  A61B6/5217 ,  G06T7/0012

Abstract: A method for determining an abnormality in a medical device from a medical image is provided. The method for determining an abnormality in a medical device comprises receiving a medical image, and detecting information on at least a part of a target medical device included in the received medical image.

公开(公告)号：US20230053280A1

公开(公告)日：2023-02-16

申请号：US17973672

申请日：2022-10-26

Applicant: LUNIT INC.

Inventor： Donggeun YOO ,  Sanghyup LEE ,  Minchul KIM ,  Hanjun LEE ,  Sunggyun PARK

IPC: A61B5/00 ,  A61B6/00

Abstract: A method for determining an abnormality in a medical device from a medical image is provided. The method for determining an abnormality in a medical device comprises receiving a medical image, and detecting information on at least a part of a target medical device included in the received medical image.