公开(公告)号：US20220187161A1

公开(公告)日：2022-06-16

申请号：US17605051

申请日：2020-04-24

Applicant: LAMBDA-X

Inventor： Philippe Antoine ,  Didier Beghuin ,  Luc Joannes

IPC: G01M11/02 ,  G01N21/45 ,  G02B27/54 ,  G02F1/1362 ,  G02B27/14

Abstract: A system for measuring (200) a sample (2) by deflectometry comprising: a source (10) for generating a light beam in a source plane (105); an illumination module (19) for forming an illumination beam (9) comprising: a first converging optical element (18); a first selection optical element (16) with a first aperture (160); reflective matrix optical modulation means (30) to form a pattern (7), said first aperture (160) being configured to control the angles of said illumination beam (9) on said reflective matrix optical modulation means (30); a Schlieren lens (20) for obtaining an angle-intensity encoding of said pattern (7) on the sample (2); imaging (40) and detecting means (50) for detecting an image of said sample (2).

公开(公告)号：USD952158S1

公开(公告)日：2022-05-17

申请号：US29710915

申请日：2019-10-28

Applicant: Lambda-X S.A.

Designer： Luc Joannes

公开(公告)号：US12000752B2

公开(公告)日：2024-06-04

申请号：US17605051

申请日：2020-04-24

Applicant: LAMBDA-X OPHTHALMICS

Inventor： Philippe Antoine ,  Didier Beghuin ,  Luc Joannes

IPC: G01M11/02 ,  G01N21/45 ,  G02B27/14 ,  G02B27/54 ,  G02F1/1362 ,  G01N21/17

CPC classification number: G01M11/0228 ,  G01M11/0207 ,  G01N21/455 ,  G02B27/149 ,  G02B27/54 ,  G02F1/136277 ,  G01N2021/1765 ,  G01N2021/456 ,  G02F2203/50

Abstract: A system for measuring (200) a sample (2) by deflectometry comprising:



a source (10) for generating a light beam in a source plane (105);
an illumination module (19) for forming an illumination beam (9) comprising:

a first converging optical element (18);
a first selection optical element (16) with a first aperture (160);


reflective matrix optical modulation means (30) to form a pattern (7), said first aperture (160) being configured to control the angles of said illumination beam (9) on said reflective matrix optical modulation means (30);
a Schlieren lens (20) for obtaining an angle-intensity encoding of said pattern (7) on the sample (2);
imaging (40) and detecting means (50) for detecting an image of said sample (2).