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公开(公告)号:US11227088B1
公开(公告)日:2022-01-18
申请号:US16951351
申请日:2020-11-18
Inventor: Mincheol Shin , SeongHyeok Jeon
IPC: G06F30/30 , G06F30/3308 , G06F30/367 , G06F111/10 , G06F119/06
Abstract: Provided is a method for simulating a semiconductor device. The method includes extracting a Hamiltonian and an overlap matrix of a semiconductor device using a density functional theory or a tight-binding method, calculating each of Bloch states for each corresponding energy, obtaining a first reduced Hamiltonian and a first reduced overlap matrix with a reduced matrix size, and calculating a final transformation matrix and a final energy band structure in which all of unphysical branches, wherein the semiconductor device includes a source region, a drain region, and a channel region between the source region and the drain region, wherein the channel region includes unit cells, each of which includes different material or has different structure.
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公开(公告)号:US11010524B2
公开(公告)日:2021-05-18
申请号:US15949268
申请日:2018-04-10
Inventor: Mincheol Shin , Woo Jin Jeong , Jaehyun Lee
IPC: G06F30/367 , G06F119/06
Abstract: Disclosed is a method for simulating characteristics of a semiconductor device. An overlap matrix and a Hamiltonian representing atomic interaction energy information of a target semiconductor device are extracted by using a density functional theory (DFT), and Bloch states for corresponding energies are calculated based on the Hamiltonian, the overlap matrix, and energy-k relation within an effective energy region. A first reduced Hamiltonian and a first reduced overlap matrix having a reduced matrix size are obtained by applying the Hamiltonian and the overlap matrix to a transformation matrix that is obtained by orthonormalizing a matrix representing the Bloch states. A final transformation matrix and a final energy band structure where all unphysical branches, which are energy bands not corresponding to a first energy band structure in a second energy band structure, are removed within the effective energy region are calculated.
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公开(公告)号:US20180293342A1
公开(公告)日:2018-10-11
申请号:US15949268
申请日:2018-04-10
Inventor: Mincheol Shin , Woo Jin Jeong , Jaehyun Lee
IPC: G06F17/50
Abstract: Disclosed is a method for simulating characteristics of a semiconductor device. An overlap matrix and a Hamiltonian representing atomic interaction energy information of a target semiconductor device are extracted by using a density functional theory (DFT), and Bloch states for corresponding energies are calculated based on the Hamiltonian, the overlap matrix, and energy-k relation within an effective energy region. A first reduced Hamiltonian and a first reduced overlap matrix having a reduced matrix size are obtained by applying the Hamiltonian and the overlap matrix to a transformation matrix that is obtained by orthonormalizing a matrix representing the Bloch states. A final transformation matrix and a final energy band structure where all unphysical branches, which are energy bands not corresponding to a first energy band structure in a second energy band structure, are removed within the effective energy region are calculated.
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