公开(公告)号：US20150309072A1

公开(公告)日：2015-10-29

申请号：US14791732

申请日：2015-07-06

Applicant: Korea Advanced Institute of Science and Technology

Inventor： Yong-Hyun KIM ,  Ho-Ki LYEO ,  Eui-Sup LEE

IPC: G01Q60/58 ,  G01Q60/14 ,  G01Q30/04

CPC classification number: G01Q60/58 ,  G01Q30/04 ,  G01Q60/10 ,  G01Q60/14

Abstract: A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position, using the following equation: V  ( r ) = V diff + S coh  ( r )  ∫ ∇ T  ( r ; r ′ ) · r ′ - r  r ′ - r  3   3  r ′ in which V(r) denotes the local thermoelectric voltage, Vdiff denotes a thermoelectric voltage drop in a diffusive transport region in a tip and a sample, Scoh(r) denotes a position-dependent Seebeck coefficient, r denotes a distance measured from a point voltage probe, r′ denotes material internal coordinates, ∇T(r;r′) denotes a temperature gradient radially weighted by a factor of 1/r2, and ∫ ∇ T  ( r ; r ′ ) · r ′ - r  r ′ - r  3   3  r ′ denotes a volume integral of a temperature profile.

Abstract translation: 提供了原子分辨率扫描塞贝克显微镜（SSM）图像的计算机辅助仿真方法。 在计算机辅助模拟方法中，计算机可以计算电压探针位置的局部热电压，以使用以下等式来获取对应于该位置的SSM图像：V（r）= V diff + S coh 其中V（r）表示局部热电电压，Vdiff表示热电电压（r），r（r），r' Scoh（r）表示与位置相关的塞贝克系数，r表示从点电压探头测得的距离，r'表示材料内部坐标，∇T（r; r' ）表示以因子1 / r2径向加权的温度梯度，并且∫∇T（r; r'）·r'-rr'-r叁3r'表示a 温度曲线。

公开(公告)号：US20140366229A1

公开(公告)日：2014-12-11

申请号：US14299170

申请日：2014-06-09

Applicant: Korea Advanced Institute of Science and Technology

Inventor： Yong-Hyun KIM ,  Ho-Ki LYEO ,  Eui-Sup LEE

IPC: G01Q60/00

CPC classification number: G01Q60/58 ,  G01Q30/04 ,  G01Q60/10 ,  G01Q60/14

Abstract: A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position, using the following equation: V  ( r ) = V diff + S coh  ( r )  ∫ ∇ T  ( r ; r ′ ) · r ′ - r  r ′ - r  3   3  r ′ in which V(r) denotes the local thermoelectric voltage, Vdiff denotes a thermoelectric voltage drop in a diffusive transport region in a tip and a sample, Scoh(r) denotes a position-dependent Seebeck coefficient, r denotes a distance measured from a point voltage probe, r′ denotes material internal coordinates, ∇T(r;r′) denotes a temperature gradient radially weighted by a factor of 1/r2, and ∫ ∇ T  ( r ; r ′ ) · r ′ - r  r ′ - r  3   3  r ′ denotes a volume integral of a temperature profile.

Abstract translation: 提供了原子分辨率扫描塞贝克显微镜（SSM）图像的计算机辅助仿真方法。 在计算机辅助模拟方法中，计算机可以计算电压探针位置的局部热电压，以使用以下等式来获取对应于该位置的SSM图像：V（r）= V diff + S coh 其中V（r）表示局部热电电压，Vdiff表示热电电压（r），r（r），r' Scoh（r）表示与位置相关的塞贝克系数，r表示从点电压探头测得的距离，r'表示材料内部坐标，∇T（r; r' ）表示以因子1 / r2径向加权的温度梯度，并且∫∇T（r; r'）·r'-rr'-r叁3r'表示a 温度曲线。