公开(公告)号：US20220299312A1

公开(公告)日：2022-09-22

申请号：US17538573

申请日：2021-11-30

Applicant: Keysight Technologies, Inc.

Inventor： Christopher Coleman ,  Ryan Scott

IPC: G01B11/00

Abstract: A system for determining optical probe location relative to a photonic integrated circuit (PIC) is described. A diffractive optical element (DOE) disposed in the PIC, and has a focal point of absolute maximum reflection at location having coordinates in three-dimensions above the PIC. The system includes an optical waveguide probe, and an optical source adapted to provide light through the optical waveguide probe and incident on the DOE. The DOE reflects and focuses light back to the optical waveguide probe, and a power meter is adapted to receive at least a portion of the light reflected and focused at the focal point above the PIC. Based on the determination of a location of the absolute maximum reflection, consistent and reliable testing of PIC can be achieved.

公开(公告)号：US20210373137A1

公开(公告)日：2021-12-02

申请号：US17126085

申请日：2020-12-18

Applicant: Keysight Technologies, Inc.

Inventor： Chan Fong Tan ,  Christopher Coleman ,  Paul L. Corredoura ,  Bogdan Szafraniec ,  Mong Long Ang

IPC: G01S7/497 ,  G02B5/10 ,  G02B26/02

Abstract: Systems and components for testing a light detection and ranging (LIDAR) device under test (DUT) are described. In one example, an ellipsoid is adapted to receive the LIDAR DUT at a first focal point, where light transmitted from the LIDAR DUT is incident on the second focal point. In another example a plurality of optical waveguides arranged in at least a portion of a circle, and the plurality of optical waveguides are adapted to receive light from the LIDAR DUT. In another example, a LIDAR distance simulator is adapted to receive an optical input, and includes optical switches that are selectively connected to one of a plurality of optical delay devices to an input of the one of a plurality of optical input channels. Illustrative delay elements may be realized through optical delay elements or a combination of optical and electrical delay elements.

公开(公告)号：US09893819B1

公开(公告)日：2018-02-13

申请号：US15416957

申请日：2017-01-26

Applicant: Keysight Technologies, Inc.

Inventor： Gregory S. Lee ,  Gregory Douglas Vanwiggeren ,  Christopher Coleman

IPC: H04B17/00 ,  H04B17/10 ,  G01R29/10

CPC classification number: H04B17/102 ,  G01R29/10

Abstract: A method determines far field EVM of a DUT using over-the-air (OTA) testing, the DUT having a transmitter/receiver and an antenna that are integrated together such that there is no connection port for interfacing a test system for directly measuring the EVM. Modulated RF signals transmitted by the DUT propagate OTA via the antenna. The method includes performing a near field scan of a bounded radiation surface, which includes measurement points at which waveforms of a repeatedly transmitted modulated RF signal are measured; downconverting the waveforms to intermediate frequency (IF), and digitizing the IF waveforms; synthesizing digital waveforms corresponding to the IF waveforms; accounting for corresponding RF propagation in the far field for the digital waveforms; providing a modulated digital IF waveform using the digital waveforms for which RF propagation has been accounted; and calculating EVM of the DUT in the far field using the modulated digital IF waveform.

公开(公告)号：US12203739B2

公开(公告)日：2025-01-21

申请号：US17538573

申请日：2021-11-30

Applicant: Keysight Technologies, Inc.

Inventor： Christopher Coleman ,  Ryan Scott

IPC: G01B11/00 ,  G02B27/42

Abstract: A system for determining optical probe location relative to a photonic integrated circuit (PIC) is described. A diffractive optical element (DOE) disposed in the PIC, and has a focal point of absolute maximum reflection at location having coordinates in three-dimensions above the PIC. The system includes an optical waveguide probe, and an optical source adapted to provide light through the optical waveguide probe and incident on the DOE. The DOE reflects and focuses light back to the optical waveguide probe, and a power meter is adapted to receive at least a portion of the light reflected and focused at the focal point above the PIC. Based on the determination of a location of the absolute maximum reflection, consistent and reliable testing of PIC can be achieved.

公开(公告)号：US20250020880A1

公开(公告)日：2025-01-16

申请号：US18899013

申请日：2024-09-27

Applicant: Keysight Technologies, Inc.

Inventor： Christopher Coleman ,  Ryan Scott

IPC: G02B6/42

Abstract: A system for determining optical probe location relative to a photonic integrated circuit (PIC) is described. A diffractive optical element (DOE), which includes a plurality of lens elements, is disposed in the PIC, and has a focal point of absolute maximum reflection at location having coordinates in three-dimensions above the PIC. The system includes an optical waveguide probe, and an optical source adapted to provide light through the optical waveguide probe and incident on the DOE. The DOE reflects and focuses light back to the optical waveguide probe, and a power meter is adapted to receive at least a portion of the light reflected and focused at the focal point above the PIC. Based on the determination of a location of the absolute maximum reflection, consistent and reliable testing of PIC can be achieved.

公开(公告)号：US10001694B1

公开(公告)日：2018-06-19

申请号：US14541014

申请日：2014-11-13

Applicant: Keysight Technologies, Inc.

Inventor： Gregory S. Lee ,  Christopher Coleman ,  Dietrich W. Vook ,  Thomas S. Low

IPC: G02F1/035 ,  G02F1/225 ,  G02F1/21

CPC classification number: G02F1/2255 ,  G02F2001/212 ,  G02F2201/12

Abstract: An optical modulator that is adapted to modulate a light signal at very high RF frequencies and provide the modulating RF signal to equipment separate from the modulator is disclosed. The modulator includes a Mach-Zehnder Modulator in which light loses due to the crossing of the RF waveguide conductors and the optical waveguides are reduced. In addition, problems arising from asynchrony between the RF signals and the optical signals are reduced. The modulator also reduces signal losses due to resonances in the modulator. The modulator can be configured to be used in test probes that require a compact configuration that is adapted to designs having multiple test probes that are proximate to each other.

公开(公告)号：US12204054B2

公开(公告)日：2025-01-21

申请号：US17126085

申请日：2020-12-18

Applicant: Keysight Technologies, Inc.

Inventor： Chan Fong Tan ,  Christopher Coleman ,  Paul L. Corredoura ,  Bogdan Szafraniec ,  Mong Long Ang

IPC: G01S7/497 ,  G02B5/10 ,  G02B26/02 ,  G01S17/10 ,  G01S17/931

Abstract: Systems and components for testing a light detection and ranging (LIDAR) device under test (DUT) are described. In one example, an ellipsoid is adapted to receive the LIDAR DUT at a first focal point, where light transmitted from the LIDAR DUT is incident on the second focal point. In another example a plurality of optical waveguides arranged in at least a portion of a circle, and the plurality of optical waveguides are adapted to receive light from the LIDAR DUT. In another example, a LIDAR distance simulator is adapted to receive an optical input, and includes optical switches that are selectively connected to one of a plurality of optical delay devices to an input of the one of a plurality of optical input channels. Illustrative delay elements may be realized through optical delay elements or a combination of optical and electrical delay elements.

公开(公告)号：US09985733B1

公开(公告)日：2018-05-29

申请号：US15359190

申请日：2016-11-22

Applicant: Keysight Technologies, Inc.

Inventor： Gregory S. Lee ,  Christopher Coleman

IPC: H04B17/29 ,  H04B17/15

CPC classification number: H04B17/29 ,  H04B17/102 ,  H04B17/15

Abstract: A test system for testing a DUT includes a first array of probe elements located in the near field of the DUT antenna that is either mechanically translated or electrically scanned in a first direction while being electrically scanned in a second direction that is different from the first direction to sense a bounded radiation surface comprising RF signals transmitted by the DUT antenna. A test system receiver receives first near field values contained in the RF signals and inputs them to processing logic of the test system. A reference measurement apparatus of the test system detects the RF signals and obtains reference information therefrom. Processing logic of the test system uses the reference information to correct near field phase values contained in or derived from the first near field values for phase shift between the local oscillator (LO) of the DUT and the LO of the test system.

公开(公告)号：US09800355B1

公开(公告)日：2017-10-24

申请号：US15382718

申请日：2016-12-18

Applicant: Keysight Technologies, Inc.

Inventor： Gregory S. Lee ,  Christopher Coleman

IPC: H04B17/00 ,  H04B17/17 ,  G01R29/10 ,  H04B17/29 ,  H04B5/00

CPC classification number: H04B17/17 ,  G01R29/10 ,  H04B5/0043 ,  H04B17/101 ,  H04B17/29 ,  H04B17/309

Abstract: A test system for testing a DUT includes near field and intermediate field measurement devices located in a near field and an intermediate field, respectively, of the DUT antenna that sample first and second bounded radiation surfaces, respectively, comprising RF signals emitted by the DUT antenna in at least first and second directions in which the bounded radiation surfaces extend. A receiver of the test system generates first and second matrices of near field and intermediate field values, respectively, from the samples obtained by the near field and intermediate field measurement devices, respectively and inputs them to processing logic of the test system. The processing logic processes the first and second matrices of near field and intermediate field values, respectively, and derives a third matrix of near field phase values therefrom.