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1.发明申请LATENCY DETECTION IN A MEMORY BUILT-IN SELF-TEST BY USING A PING SIGNAL 失效通过使用PING信号自动检测内存中的LATENCY检测公开(公告)号：US20100223513A1
公开(公告)日：2010-09-02
申请号：US12709605
申请日：2010-02-22
申请人： Kay Hesse , Suresh Periyacheri
发明人： Kay Hesse , Suresh Periyacheri
CPC分类号： G11C29/38 , G11C29/02 , G11C29/023 , G11C29/12 , G11C29/50 , G11C29/50012
摘要： In a complex semiconductor device including embedded memories, the round trip latency may be determined during a memory self-test by applying a ping signal having the same latency as control and failure signals used during the self-test. The ping signal may be used for controlling an operation counter in order to obtain a reliable correspondence between the counter value and a memory operation causing a specified memory failure.
摘要翻译： 在包括嵌入式存储器的复杂半导体器件中，可以在存储器自检期间通过应用与在自检期间使用的控制和故障信号具有相同等待时间的ping信号来确定往返延迟。 ping信号可以用于控制操作计数器，以便获得计数器值与导致指定的存储器故障的存储器操作之间的可靠对应关系。
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2.发明授权公开(公告)号：US08458538B2
公开(公告)日：2013-06-04
申请号：US12709605
申请日：2010-02-22
申请人： Kay Hesse , Suresh Periyacheri
发明人： Kay Hesse , Suresh Periyacheri
IPC分类号： G11C29/00
CPC分类号： G11C29/38 , G11C29/02 , G11C29/023 , G11C29/12 , G11C29/50 , G11C29/50012
摘要： In a complex semiconductor device including embedded memories, the round trip latency may be determined during a memory self-test by applying a ping signal having the same latency as control and failure signals used during the self-test. The ping signal may be used for controlling an operation counter in order to obtain a reliable correspondence between the counter value and a memory operation causing a specified memory failure.
摘要翻译： 在包括嵌入式存储器的复杂半导体器件中，可以在存储器自检期间通过应用与在自检期间使用的控制和故障信号具有相同等待时间的ping信号来确定往返延迟。 ping信号可以用于控制操作计数器，以便获得计数器值与导致指定的存储器故障的存储器操作之间的可靠对应关系。
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