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1.
公开(公告)号:US20180355213A1
公开(公告)日:2018-12-13
申请号:US15883655
申请日:2018-01-30
Applicant: Samsung Electronics Co., Ltd. , KCTECH CO., LTD.
Inventor: Seung Ho Park , Hyun Goo KONG , Jung Hun KIM , Sang Mi LEE , Woo In LEE , Hee Sook CHEON , Sang Kyun KIM , Hao CUI , Jong Hyuk PARK , Il Young YOON
IPC: C09G1/02 , H01L21/28 , H01L27/108 , H01L21/321
CPC classification number: C09G1/02 , H01L21/28079 , H01L21/28123 , H01L21/3212 , H01L27/10814 , H01L27/10823 , H01L27/10876
Abstract: A slurry composition for polishing a metal layer and a method for fabricating a semiconductor device using the same are provided. The slurry composition for polishing a metal layer includes polishing particles including a metal oxide, an oxidizer including hydrogen peroxide, and a first polishing regulator including at least one selected from a group consisting of phosphate, phosphite, hypophosphite, and metaphosphate, wherein a content of the oxidizer is 0.01 wt % to 0.09 wt % with respect to 100 wt % of the slurry composition for polishing the metal layer.
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公开(公告)号:US20240158667A1
公开(公告)日:2024-05-16
申请号:US18281558
申请日:2022-03-07
Applicant: KCTECH CO., LTD.
Inventor: Jung Hun KIM , Jun Ha HWANG , O Seong KWON
IPC: C09G1/02
CPC classification number: C09G1/02
Abstract: The present disclosure relates to a polishing slurry composition and to a polishing slurry composition including nanoceria abrasive particles and a water-soluble compound including an intramolecular hydrophilic group, and further selectively including at least one from among an amphoteric compound including an intramolecular carboxyl group and amine group, a surface modifier including an organic acid, and a pH adjuster.
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公开(公告)号:US20230072716A1
公开(公告)日:2023-03-09
申请号:US17897222
申请日:2022-08-29
Applicant: KCTECH CO., LTD.
Inventor: Jung Hun KIM , Jeong Gyu LEE , Hyo Jun JANG
Abstract: The present disclosure relates to cerium oxide abrasive particles and a polishing slurry composition, and more particularly, to cerium oxide abrasive particles comprising: an element cerium; and a modifier and satisfying the agglomeration ratios calculated from the relational expressions of the primary particle sizes and the secondary particle sizes, and a polishing slurry composition comprising the same.
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