公开(公告)号：US11243230B2

公开(公告)日：2022-02-08

申请号：US16730338

申请日：2019-12-30

Applicant: Juniper Networks, Inc.

Inventor： Molly Piels ,  Anand Ramaswamy ,  Brandon Gomez

IPC: G01R1/067 ,  G01R31/3185 ,  G01R31/308

Abstract: Described are various configurations for performing efficient optical and electrical testing of an opto-electrical device using a compact opto-electrical probe. The compact opto-electrical probe can include electrical contacts arranged for a given electrical contact layout of the opto-electrical device, and optical interface with a window in a probe core that transmits light from the opto-electrical device. An adjustable optical coupler of the probe can be mechanically positioned to receive light from the device's emitter to perform simultaneous optical and electrical analysis of the device.

公开(公告)号：US20220029705A1

公开(公告)日：2022-01-27

申请号：US17476122

申请日：2021-09-15

Applicant: Juniper Networks, Inc.

Inventor： John Parker ,  John Garcia ,  Brandon Gomez ,  Molly Piels ,  Anand Ramaswamy

IPC: H04B10/079 ,  H04B10/40

Abstract: An optical device such as an optical transceiver can include a cascaded built-in self-test structure that can be configured in testing mode using an active power mode and can sufficiently attenuate light away from a loopback path in an inactive power mode. The optical device can include a wafer top emitter that can be used to tune a light source for testing and calibration of optical components while the built-in self-test structure is in active mode.

公开(公告)号：US20220107341A1

公开(公告)日：2022-04-07

申请号：US17552847

申请日：2021-12-16

Applicant: Juniper Networks, Inc.

Inventor： Molly Piels ,  Anand Ramaswamy ,  Brandon Gomez

IPC: G01R1/067 ,  G01R31/3185

Abstract: Described are various configurations for performing efficient optical and electrical testing of an opto-electrical device using a compact opto-electrical probe. The compact opto-electrical probe can include electrical contacts arranged for a given electrical contact layout of the opto-electrical device, and optical interface with a window in a probe core that transmits light from the opto-electrical device. An adjustable optical coupler of the probe can be mechanically positioned to receive light from the device's emitter to perform simultaneous optical and electrical analysis of the device.

公开(公告)号：US11153009B1

公开(公告)日：2021-10-19

申请号：US16934525

申请日：2020-07-21

Applicant: Juniper Networks, Inc.

Inventor： John Parker ,  John Garcia ,  Brandon Gomez ,  Molly Piels ,  Anand Ramaswamy

IPC: H04B10/079 ,  H04B10/40

Abstract: An optical device such as an optical transceiver can include a cascaded built-in self-test structure that can be configured in testing mode using an active power mode and can sufficiently attenuate light away from a loopback path in an inactive power mode. The optical device can include a wafer top emitter that can be used to tune a light source for testing and calibration of optical components while the built-in self-test structure is in active mode.

公开(公告)号：US20210199691A1

公开(公告)日：2021-07-01

申请号：US16730338

申请日：2019-12-30

Applicant: Juniper Networks, Inc.

Inventor： Molly Piels ,  Anand Ramaswamy ,  Brandon Gomez

IPC: G01R1/067 ,  G01R31/3185

Abstract: Described are various configurations for performing efficient optical and electrical testing of an opto-electrical device using a compact opto-electrical probe. The compact opto-electrical probe can include electrical contacts arranged for a given electrical contact layout of the opto-electrical device, and optical interface with a window in a probe core that transmits light from the opto-electrical device. An adjustable optical coupler of the probe can be mechanically positioned to receive light from the device's emitter to perform simultaneous optical and electrical analysis of the device.