摘要:
Disclosed embodiments relate to a display deformation detection system that detects display deformations based upon changes in resistance and/or capacitance. In one embodiment, a method includes measuring a baseline comprising a baseline resistance or a baseline capacitance or both of a conductive mesh disposed within or overlaid on the display panel. The method further includes detecting a change in the baseline resistance or the baseline capacitance or both and calculating a change location where the change in the baseline resistance or the baseline capacitance or both occurred. The method also includes calculating a magnitude of the change in the baseline resistance or the baseline capacitance or both.
摘要:
Disclosed embodiments relate to a display temperature detection system that can detect temperature variations in different regions of a display panel. The temperature measuring display system includes a display panel that provides graphical images. Further, the temperature measuring display system includes temperature measurement circuitry. The temperature measurement circuitry includes one or more thermal diodes, transistors, or a mesh layer useful to determine at least one temperature measurement of the display panel.
摘要:
Disclosed embodiments relate to a display temperature detection system that can detect temperature variations in different regions of a display panel. The temperature measuring display system includes a display panel that provides graphical images. Further, the temperature measuring display system includes temperature measurement circuitry. The temperature measurement circuitry includes one or more thermal diodes, transistors, or a mesh layer useful to determine at least one temperature measurement of the display panel.
摘要:
Systems and methods for manufacturing a display panel or other patterned device using outer resistive trace(s) patterned on the display panel or other patterned device are provided. Such a system, for example, may include resistance detection circuitry, a grinder, and data processing circuitry. The resistance detection circuitry may detect a resistance of a resistive trace disposed around a display panel. The grinder may grind a first edge of the display panel such that at least part of the resistive trace is grinded away as the first edge of the display panel is grinded. The data processing circuitry may control the grinder to stop grinding the first edge of the display panel when the resistance of the at least one resistive trace increases to a particular resistance value.
摘要:
Systems and methods for evaluating whether a display panel is of specified dimensions are provided. Such a system, for example, may include resistance detection circuitry that detects a resistance of at least one resistive trace disposed around a display panel or other patterned device. Data processing circuitry may determine, based at least in part on the detected resistance, whether the display panel is of a specified size or whether the display panel has specified dimensions, or a combination thereof. Additionally or alternatively, the system may determine whether a touch sensor panel (e.g., a single-sided indium tin oxide (SITO) or double-sided indium tin oxide (DITO) touch sensor panel), a flexible printed circuit (FPC), a printed circuit board (PCB), or any other suitable patterned device, is of a specified size or has specified dimensions.
摘要:
Systems, methods, and devices for detecting display panel or other patterned device fractures or microfractures using outer resistive trace(s) on the display panel or the other patterned device. To provide just one example, a system may include a display and data processing circuitry. The display may include a display panel with an outer resistive trace disposed near edges of the display panel. The display may include discontinuity detection circuitry that can detect the occurrence of a discontinuity of the outer resistive trace. The data processing circuitry may determine whether the display panel is likely to suffer a catastrophic failure based at least in part on the occurrence of the discontinuity. The data processing circuitry may also cause the display to display a user warning when the display panel is likely to suffer the catastrophic failure.
摘要:
The present disclosure generally relates to systems and techniques for calibrating displays to improve the white point uniformity between similar type devices. In one embodiment, a backlight includes multiple strings of LEDs, where each string is driven by a separate driver, or driver channel. Each string may be separately tested at a base current to determine its emitted chromaticity, and values indicative of the emitted chromaticities may be stored within the backlight as calibration values. The calibration values may then be used to determine the driving strength for each string that allows the display to produce the target white point when the light from the strings is mixed. Further, in certain embodiments, adjustments also may be made to the LCD panel based on the emitted chromaticities at the base current.
摘要:
The present disclosure generally relates to systems and techniques for calibrating displays to improve the white point uniformity between similar type devices. In one embodiment, a backlight includes multiple strings of LEDs, where each string is driven by a separate driver, or driver channel. Each string may be separately tested at a base current to determine its emitted chromaticity, and values indicative of the emitted chromaticities may be stored within the backlight as calibration values. The calibration values may then be used to determine the driving strength for each string that allows the display to produce the target white point when the light from the strings is mixed. Further, in certain embodiments, adjustments also may be made to the LCD panel based on the emitted chromaticities at the base current.