Charged particle beam apparatus
    1.
    发明授权

    公开(公告)号:US11776787B2

    公开(公告)日:2023-10-03

    申请号:US17570043

    申请日:2022-01-06

    Applicant: JEOL Ltd.

    Abstract: A charged particle beam apparatus includes a tilt mechanism that tilts a specimen, a detector that detects an electromagnetic wave emitted from the specimen, a table storage unit that stores a table in which tilt angle information on a tilt angle of the specimen and detection solid-angle information on the detection solid angle of the detector are associated with each other, a tilt control unit that controls the tilt mechanism, and a detection-solid-angle information acquisition unit that acquires the tilt angle information from the tilt control unit and acquires the detection solid-angle information with reference to the table.

    Charged Particle Beam Apparatus
    3.
    发明申请

    公开(公告)号:US20220216033A1

    公开(公告)日:2022-07-07

    申请号:US17570043

    申请日:2022-01-06

    Applicant: JEOL Ltd.

    Abstract: A charged particle beam apparatus includes a tilt mechanism that tilts a specimen, a detector that detects an electromagnetic wave emitted from the specimen, a table storage unit that stores a table in which tilt angle information on a tilt angle of the specimen and detection solid-angle information on the detection solid angle of the detector are associated with each other, a tilt control unit that controls the tilt mechanism, and a detection-solid-angle information acquisition unit that acquires the tilt angle information from the tilt control unit and acquires the detection solid-angle information with reference to the table.

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