Abstract:
The object of the invention is to provide an infrared circular dichroism measuring apparatus that improves the measuring time and the measuring accuracy. An infrared circular dichroism measuring apparatus 101 comprising: AC signal extractors 110-112 where an interference light beam from an IR light source 102 which has passed an interferometer 103 is converted into a clockwise and a counterclockwise circularly polarized light beams and is irradiated on a sample to extract from a detected signal of detector 107 an interferogram by each of the circularly polarized light beams; DC signal extractors 113, 112 for extracting an interferogram by the IR absorption of the sample; a calculator 114 for figuring out the circular dichroism; and a selective transmitter 120 for narrowing down the wavelength region to be measured based on an IR absorption wavelength region corresponding to a vibration mode of the structure to be measured in the sample molecule.
Abstract:
It is an object of the present invention to provide a data acquiring method in an infrared imaging apparatus comprising an FTIR device of a continuous scan type for detecting a signal by a multi-element detector. A method of acquiring data from a multi-element detector in an infrared imaging apparatus comprising the steps of scanning each element of the multi-element detector in order synchronously with a sampling signal (12) generated by a reference signal (10) of an interferometer and repeating a series of scanning operations after completely scanning all the elements, thereby carrying out scan, shifting a starting point of sampling in next scan by one element from the starting point of the previous scan, thereby carrying out the same scanning, and repeating the scan at the number of times corresponding to the number of all the elements and then extracting data for each element from storing sampling data, thereby acquiring a data sequence of all the sampling points for each element.
Abstract:
It is an object of the present invention to provide a method capable of acquiring data at a high speed while holding proper precision in measurement in an infrared imaging apparatus comprising an FTIR device of a continuous scan type for detecting a signal by a multi-element detector. A method of acquiring data from a multi-element detector in an infrared imaging apparatus comprising the steps of starting to scan a element of the said multi-element detector synchronously with a sampling signal (12) based on a reference signal (10) of an interferometer, scanning the element at a higher frequency than a sampling frequency of the sampling signal (12), completing the scanning of all the elements before a next sampling signal to the sampling signal starting the element scanning is generated, and repeating a series of operations every time the sampling signal is generated.