公开(公告)号：US20240220312A1

公开(公告)日：2024-07-04

申请号：US18091810

申请日：2022-12-30

Applicant: Intel Corporation

Inventor： Rakesh Kandula ,  Shlomo Avni ,  Fei Su

IPC: G06F9/48 ,  G06F11/263

CPC classification number: G06F9/4812 ,  G06F11/263

Abstract: Methods and apparatus relating to intelligent sensors for high quality silicon life cycle management as well as efficient infield structural and/or functional testing are described. In an embodiment, one or more registers store configuration data. A sensor having sensor event detection logic circuitry detects an event based at least in part on one or more sensor signals and the stored configuration data. The sensor event detection logic circuitry generates a signal to cause interrupt generator logic circuitry of the sensor to generate an interrupt. Other embodiments are also disclosed and claimed.