公开(公告)号：US20250006592A1

公开(公告)日：2025-01-02

申请号：US18217208

申请日：2023-06-30

Applicant: Intel Corporation

Inventor： Ming-Yi Shen ,  Chi-Hing Choi ,  Jaladhi Mehta ,  Tofizur Rahman ,  Payam Amin ,  Justin E. Mueller ,  Vincent Hipwell ,  Cortnie S. Vogelsberg ,  Shivani Falgun Patel

IPC: H01L23/48 ,  H01L21/768 ,  H01L27/088

Abstract: Techniques to form low-resistance vias are discussed. In an example, semiconductor devices of a given row each include a semiconductor region extending in a first direction between corresponding source or drain regions, and a gate structure extending in a second direction over the semiconductor regions. Any semiconductor device may be separated from an adjacent semiconductor device along the second direction by a dielectric structure, through which a via passes. The via may include a conductive portion that extends through a dielectric wall in a third direction along at least an entire thickness of the gate structure. The conductive portion includes a conductive liner directly on the dielectric wall and a conductive fill on the conductive liner. The conductive liner comprises a pure elemental metal, such as tungsten, molybdenum, ruthenium, or a nickel aluminum alloy, with no metal nitride or barrier layer present between the conductive liner and the dielectric wall.

公开(公告)号：US20230102711A1

公开(公告)日：2023-03-30

申请号：US17485151

申请日：2021-09-24

Applicant: Intel Corporation

Inventor： Ming-Yi Shen ,  Nita Chandrasekhar ,  Blake Bluestein ,  Tiffany Zink ,  Shaestagir Chowdhury

IPC: H01L23/532 ,  H01L23/522 ,  H01L21/768

Abstract: Integrated circuit structures including an interconnect feature without a higher-resistance liner material. In absence of a liner, metal of low resistance directly contacts an adjacent dielectric material, enabling lower resistance interconnect. Even for low-k dielectric compositions, adhesion of the metal to the dielectric material is improved through the incorporation of nitrogen proximal to the interface. Prior to deposition of the metal upon a surface of the dielectric, the surface is exposed to nitrogen species to form a nitrogen-rich compound at the surface. The metal deposited upon the surface may then be nitrogen-lean, for example a substantially pure elemental metal or metal alloy.