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公开(公告)号:US20240167125A1
公开(公告)日:2024-05-23
申请号:US18284172
申请日:2022-03-18
发明人: Yasunori EGAWA , Atsuo MATSUZAWA , Koichi HASEGAWA , Yosuke IMAI , Kenichi SATO
CPC分类号: C22C30/02 , C22C5/04 , C22C9/00 , G01R1/06755
摘要: Provided is a probe material (an alloy material for probe pins) that can suppress diffusion of components between solder in a circuit connecting portion of an inspection target and the probe material during probe inspection. The alloy material for probe pins consists of 15 mass % to 60 mass % of Pd, 3 mass % to 79.9 mass % of Cu, and 0.1 mass % to 75 mass % of Ni and/or Pt.
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公开(公告)号:US20220082588A1
公开(公告)日:2022-03-17
申请号:US17421731
申请日:2020-01-23
申请人: YOKOWO CO., LTD.
发明人: Kenichi SATO
IPC分类号: G01R1/067
摘要: A plunger includes a conductive base layer, and a platinum group layer which is provided on the outside of the base layer and which contains a platinum group element as a main component. The plunger has the base layer as its base material, and has the platinum group layer on the outside of the base layer at the tip part to come into contact with an inspection object. A contact probe includes the plunger, and a spring which abuts on the plunger at an end part.
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公开(公告)号:US20240175897A1
公开(公告)日:2024-05-30
申请号:US18284072
申请日:2022-03-18
申请人: YOKOWO CO., LTD.
发明人: Kenichi SATO
摘要: A probe includes greater than or equal to 15 mass % and less than or equal to 60 mass % of Pd, greater than or equal to 3 mass % and less than or equal to 79.9 mass % of Cu, and greater than or equal to 0.1 mass % and less than or equal to 75 mass % of at least one of Ni and Pt.
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公开(公告)号:US20210199689A1
公开(公告)日:2021-07-01
申请号:US17202334
申请日:2021-03-15
申请人: YOKOWO CO., LTD.
发明人: Tsugio YAMAMOTO , Kenichi SATO , Takayoshi OKUNO
摘要: A socket includes: a contact probe; and an insulating support body supporting the contact probe. The contact probe includes: a first plunger to be connected with an object to be inspected; a second plunger to be connected with an inspecting board; and a spring configured to urge the first plunger and the second plunger in a direction apart from each other. In a state where a tip end of the first plunger is released, a projecting amount of the second plunger from the insulating support body is zero with a natural length of the spring.
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公开(公告)号:US20160308297A1
公开(公告)日:2016-10-20
申请号:US14916243
申请日:2014-08-20
申请人: YOKOWO CO., LTD.
发明人: Kenichi SATO
CPC分类号: H01R13/2421 , H01R43/28
摘要: A spring connector includes a plunger; a contact member; and a spring for urging the plunger and the contact member so as to separate the plunger and the contact member from each other. The spring is an insulation coated metallic wire which is molded into a coil-like shape. Metal is exposed from both end faces of the insulation coated metallic wire, and at least one end part of the spring is bent inward.
摘要翻译: 弹簧连接器包括柱塞; 联系人; 以及用于推压柱塞和接触构件以将柱塞和接触构件彼此分离的弹簧。 弹簧是模制成线圈状的绝缘涂层金属线。 金属从绝缘涂覆的金属线的两个端面露出,并且弹簧的至少一个端部向内弯曲。
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公开(公告)号:US20230393171A1
公开(公告)日:2023-12-07
申请号:US18033084
申请日:2021-10-08
申请人: YOKOWO CO., LTD.
发明人: Kenichi SATO
IPC分类号: G01R1/067
CPC分类号: G01R1/06722 , G01R1/06761
摘要: A contact probe includes a first plunger including a tip portion and a base end portion, and a spring configured to bias the first plunger, in which a surface of the tip portion and a surface of the base end portion are formed of metal materials which are different from each other.
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公开(公告)号:US20220214376A1
公开(公告)日:2022-07-07
申请号:US17604492
申请日:2020-03-24
申请人: YOKOWO CO., LTD.
发明人: Kenichi SATO
IPC分类号: G01R1/067
摘要: A contact probe capable of being used for an inspection of a semiconductor package in which a recess is formed in a terminal portion includes a plunger including a distal end portion that comes into contact with the terminal portion. The distal end portion includes a protruding portion protruding toward the terminal portion and a shoulder portion having a protruding height toward the terminal portion lower than that of the protruding portion.
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公开(公告)号:US20170248630A1
公开(公告)日:2017-08-31
申请号:US15441366
申请日:2017-02-24
申请人: YOKOWO CO., LTD.
发明人: Tsugio YAMAMOTO , Kenichi SATO , Takayoshi OKUNO
CPC分类号: G01R1/0433 , G01R1/0441 , G01R1/06722 , G01R31/2886
摘要: A socket includes: a contact probe; and an insulating support body supporting the contact probe. The contact probe includes: a first plunger to be connected with an object to be inspected; a second plunger to be connected with an inspecting board; and a spring configured to urge the first plunger and the second plunger in a direction apart from each other. In a state where a tip end of the first plunger is released, a projecting amount of the second plunger from the insulating support body is zero with a natural length of the spring.
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