- 专利标题: PLUNGER AND CONTACT PROBE
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申请号: US17421731申请日: 2020-01-23
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公开(公告)号: US20220082588A1公开(公告)日: 2022-03-17
- 发明人: Kenichi SATO
- 申请人: YOKOWO CO., LTD.
- 申请人地址: JP Kita-ku, Tokyo
- 专利权人: YOKOWO CO., LTD.
- 当前专利权人: YOKOWO CO., LTD.
- 当前专利权人地址: JP Kita-ku, Tokyo
- 优先权: JP2019-012725 20190129
- 国际申请: PCT/JP2020/002356 WO 20200123
- 主分类号: G01R1/067
- IPC分类号: G01R1/067
摘要:
A plunger includes a conductive base layer, and a platinum group layer which is provided on the outside of the base layer and which contains a platinum group element as a main component. The plunger has the base layer as its base material, and has the platinum group layer on the outside of the base layer at the tip part to come into contact with an inspection object. A contact probe includes the plunger, and a spring which abuts on the plunger at an end part.
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