公开(公告)号：US20240067467A1

公开(公告)日：2024-02-29

申请号：US18272323

申请日：2021-10-13

Applicant: Hitachi High-Tech Corporation

Inventor： Takeshi TAMAKOSHI ,  Shigeru YANO ,  Shinji AZUMA ,  Yuichiro SHIGA ,  Daigo SHISHIDO

IPC: B65G54/02 ,  G01N35/04

CPC classification number: B65G54/02 ,  G01N35/04 ,  G01N2035/0477

Abstract: There are provided a sample conveyance system and a sample conveyance method capable of conveying a sample in a more stable manner than in the related art corresponding to a conveyance method using an electromagnetic actuator. A driving unit 208 applies a first voltage to a first coil 207a located on a front side in a traveling direction of a holder 202, which is selected to attract or repel the holder 202, to excite the first coil 207a and applies a second voltage having a polarity opposite to a polarity of the first voltage to at least one or more of second coils 207b among coils 207 adjacent to the first coil 207a except for the coils 207 in the front side in the traveling direction to excite the second coil 207b, and a control unit 210A estimates a position of the holder 202 based on a value of a current flowing through a winding 206 of the first coil 207a.

公开(公告)号：US20230070391A1

公开(公告)日：2023-03-09

申请号：US17794458

申请日：2021-01-07

Applicant: Hitachi High-Tech Corporation

Inventor： Daigo SHISHIDO ,  Kuniaki ONIZAWA

IPC: G01N35/04 ,  B65G54/02

Abstract: Provided are a specimen transport system and a specimen transport method that support a transport method using an electromagnetic actuator and can transport a specimen at higher speed and more stably as compared to the related art.
A plurality of detection points each configured by a magnetic pole 207 and detecting a position of a magnetic body 203, and a plurality of transport paths provided above the plurality of detection points so as to cover the plurality of detection points are provided, in which among the plurality of transport paths, detection ranges 301A, 301B, and 301C of first detection points constituting a first transport path are different from detection ranges 301A, 301B, and 301C of second detection points constituting a second transport path different from the first transport path.

公开(公告)号：US20240420832A1

公开(公告)日：2024-12-19

申请号：US18698035

申请日：2022-09-26

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Daigo SHISHIDO ,  Kuniaki ONIZAWA

IPC: G16H40/40

Abstract: In order to enable easy setting of a configuration of a specimen inspection automation system, the present disclosure proposes a technique for automatically allocating an IP address (unique position information) to each unit constituting the specimen inspection automation system. For example, the present disclosure proposes a specimen inspection automation system comprising: a plurality of slave station devices each of which corresponds to at least one of a transport device for transporting a specimen and an analyzer for analyzing the specimen; and a master station device that communicates with the slave station devices through a communication line and controls the slave station devices. The master station device performs a process for allocating unique position information to each of the slave station devices by using information acquired through communication with the slave station devices.