SEMICONDUCTOR STORAGE DEVICE AND MANUFACTURING METHOD THEREOF
    1.
    发明申请
    SEMICONDUCTOR STORAGE DEVICE AND MANUFACTURING METHOD THEREOF 审中-公开
    半导体存储器件及其制造方法

    公开(公告)号:US20120299078A1

    公开(公告)日:2012-11-29

    申请号:US13419994

    申请日:2012-03-14

    IPC分类号: H01L29/78 H01L21/336

    摘要: According to one embodiment, there is disclosed a semiconductor storage device comprising a semiconductor substrate and a plurality of electrical rewritable nonvolatile memory cells. Each of the memory cells includes a floating gate and a control gate on the semiconductor substrate. Each of the memory cells shares a source/drain region with an adjacent memory cell. The memory cells are connected serially and configure a NAND cell unit. The source/drain region includes silicide layer.

    摘要翻译: 根据一个实施例,公开了一种包括半导体衬底和多个电可重写非易失性存储单元的半导体存储器件。 每个存储单元包括半导体衬底上的浮动栅极和控制栅极。 每个存储器单元与相邻的存储器单元共享源极/漏极区域。 存储器单元串联连接并配置NAND单元单元。 源极/漏极区域包括硅化物层。