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公开(公告)号:US20180097081A1
公开(公告)日:2018-04-05
申请号:US15663584
申请日:2017-07-28
Applicant: HRL Laboratories, LLC
Inventor: Yu CAO , Rongming CHU , Zijian Ray Li
IPC: H01L29/51 , H01L29/778 , H01L21/28 , H01L29/423 , H01L29/78
Abstract: A field effect transistor having at least a gate, source, and drain electrodes and a semiconductor channel for controlling transport of charge carriers between the source and drain electrodes, the gate being insulated from the channel by an dielectric, at least a portion of the dielectric disposed between the gate electrode and the semiconductor channel being doped or imbued with the an element which if doped or imbued into a semiconductor material would cause the semiconductor to be p-type. The p-type element used to dope or imbue the gate dielectric is preferably Mg.
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公开(公告)号:US10903333B2
公开(公告)日:2021-01-26
申请号:US15663584
申请日:2017-07-28
Applicant: HRL Laboratories, LLC
Inventor: Yu Cao , Rongming Chu , Zijian Ray Li
IPC: H01L29/51 , H01L29/20 , H01L29/778 , H01L29/78 , H01L29/417 , H01L29/43 , H01L29/06 , H01L21/28 , H01L29/423
Abstract: A field effect transistor having at least a gate, source, and drain electrodes and a semiconductor channel for controlling transport of charge carriers between the source and drain electrodes, the gate being insulated from the channel by an dielectric, at least a portion of the dielectric disposed between the gate electrode and the semiconductor channel being doped or imbued with the an element which if doped or imbued into a semiconductor material would cause the semiconductor to be p-type. The p-type element used to dope or imbue the gate dielectric is preferably Mg.
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公开(公告)号:US11437485B2
公开(公告)日:2022-09-06
申请号:US17131518
申请日:2020-12-22
Applicant: HRL Laboratories, LLC
Inventor: Yu Cao , Rongming Chu , Zijian Ray Li
IPC: H01L21/336 , H01L29/51 , H01L29/20 , H01L29/778 , H01L29/78 , H01L29/417 , H01L29/43 , H01L29/06 , H01L21/28 , H01L29/423
Abstract: A field effect transistor having at least a gate, source, and drain electrodes and a semiconductor channel for controlling transport of charge carriers between the source and drain electrodes, the gate being insulated from the channel by an dielectric, at least a portion of the dielectric disposed between the gate electrode and the semiconductor channel being doped or imbued with the an element which if doped or imbued into a semiconductor material would cause the semiconductor to be p-type. The p-type element used to dope or imbue the gate dielectric is preferably Mg.
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