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公开(公告)号:US10114204B2
公开(公告)日:2018-10-30
申请号:US15304632
申请日:2015-04-17
Applicant: HORIBA JOBIN YVON SAS
Inventor: Emmanuel Fretel , Damien Andrezejeusky , Rene Boidin , Philippe De Bettignies
Abstract: An optical beam scanning microscopy apparatus includes a light source adapted to emit an optical beam (2) and a microscope objective (1) adapted for focusing the optical beam (2) in an object plane (11). The microscopy apparatus includes first and second reflecting optical elements (M-X1, M-X2) disposed in series on the optical path of the optical beam (2) between the light source and the microscope objective (1), first elements of angular tilting (21, 25) adapted for tilting the first reflecting optical elements (M-X1, M-XY1) according to a first predetermined rotation angle (RX1), and second elements of angular tilting (22, 26) adapted for tilting the second reflecting optical elements (M-X2, M-XY2) according to a second rotation angle (RX2), in such a way as to angularly tilt the axis (12) of the optical beam (2) by pivoting about the center (O) of the pupil of the microscope objective (1).
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公开(公告)号:US10139346B2
公开(公告)日:2018-11-27
申请号:US15121632
申请日:2015-02-24
Applicant: HORIBA JOBIN YVON SAS
Inventor: Bertrand Dutertre , Denis Cattelan , Emmanuel Fretel
Abstract: An optical apparatus for Raman scattering microscopy includes a laser source that emits a laser beam at an excitation wavelength λ, a microscope objective that receives the laser beam and focuses the laser beam in an image plane of the microscope objective, the focused laser beam being intended to illuminate a sample, an optical system for collecting a Raman scattering optical beam, and detection elements suitable for detecting the Raman scattering beam collected. More particularly, the Raman scattering microscopy apparatus further includes an adaptive optics system positioned on an optical path of the Raman scattering beam, the said adaptive optics system is configured to form the image of an energy distribution inside the confocal hole on the entrance slit of the spectrometer in such a way as to obtain an energy distribution in a direction of a height of the slit.
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