公开(公告)号：US20170082537A1

公开(公告)日：2017-03-23

申请号：US15366054

申请日：2016-12-01

申请人： HORIBA, LTD.

发明人： Takuya IDO ,  Yasushi HIRATA ,  Toshiaki NAKAGAWA

IPC分类号： G01N21/55 ,  G01N33/00

CPC分类号： G01N21/55 ,  G01N21/3504 ,  G01N21/61 ,  G01N21/8507 ,  G01N33/0036 ,  G01N2021/158 ,  G01N2021/8514 ,  G01N2021/8578 ,  G01N2201/0231 ,  G01N2201/06113 ,  G01N2201/0636

摘要： A gas analysis device includes a probe tube, a flange, an optical system member, and heaters. The probe tube includes an optical path through which measurement light is projected onto a prescribed measurement region of a sample gas flowing through a flue and/or is received from the measurement region. The flange is fixed to the outer periphery of the probe tube and is attached to a pipe side wall. The optical system member projects measurement light onto the sample gas S within the measurement region and/or receives measurement light from the measurement region. The heaters are disposed within the flange and heats the portion where the probe tube and flange are fixed to each other.

公开(公告)号：US20240146020A1

公开(公告)日：2024-05-02

申请号：US18280195

申请日：2022-02-21

申请人： HORIBA, LTD.

发明人： Yusuke AWANE ,  Makoto MATSUHAMA ,  Kosuke TSUKATANI ,  Kodai NIINA ,  Takuya IDO

IPC分类号： H01S5/028 ,  G01N21/31 ,  G01N33/00 ,  H01S5/022

CPC分类号： H01S5/028 ,  G01N21/31 ,  G01N33/0027 ,  H01S5/022 ,  G01N2201/06113

摘要： To suppress individual differences in intensity of output laser light for each semiconductor laser device as much as possible while suppressing generation of stray light in a package of the semiconductor laser device, provided is a semiconductor laser device used for optical analysis, including: a package that accommodates a semiconductor laser element therein; and a light reflection reducing member that is provided inside the package and suppresses reflection of light emitted from the semiconductor laser element, in which the light reflection reducing member is bonded to an inner surface of the package.

公开(公告)号：US20170205336A1

公开(公告)日：2017-07-20

申请号：US15406932

申请日：2017-01-16

申请人： HORIBA, LTD.

发明人： Takuya IDO

IPC分类号： G01N21/27

CPC分类号： G01N21/274 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/423 ,  G01N21/314 ,  G01N21/3504 ,  G01N21/3554 ,  G01N21/359 ,  G01N21/39 ,  G01N21/8507 ,  G01N2021/8521 ,  G01N2201/0612 ,  G01N2201/127

摘要： To check an influence to an absorbance due to a temporal variation of measuring light in an analyzing apparatus, the analyzing apparatus includes a reference gas filling space, a spectrum generating portion, and a spectrum comparing portion. The reference gas filling space is formed on an optical path of measuring light and is filled with a reference gas different from a measurement target gas at a first concentration. The spectrum generating portion generates measured spectrum data, associating a wavelength of a detection light beam as the measuring light after passing through the reference gas filling space with a relative intensity of the detection light beam. The spectrum comparing portion calculates a difference between the measured spectrum data and reference absorption spectrum data obtained by measuring in advance an absorption spectrum of the reference gas at the first concentration by a direct absorption method.