公开(公告)号：US20240011833A1

公开(公告)日：2024-01-11

申请号：US18343129

申请日：2023-06-28

Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION

Inventor： Akihiro Nojima ,  Yusuke Kaga ,  Takuya Kambayashi ,  Jun Horigome ,  Kai Maruyama

IPC: G01J3/44 ,  G01J3/02 ,  G01J3/06

CPC classification number: G01J3/4406 ,  G01J3/027 ,  G01J3/06 ,  G01J3/0264 ,  G01J2003/064 ,  G01J2003/068 ,  G01J2003/2836

Abstract: A spectroscopic analysis system includes: an operation panel configured to receive an input of at least one of an upper limit value of a measurement period of a spectroscopic analysis spectrum or a lower limit value of measurement accuracy as a user setting condition related to measurement of the spectroscopic analysis spectrum of a sample; and a control unit configured to derive a predetermined recommended measurement condition that satisfies the user setting condition and cause a display unit to display the recommended measurement condition, in which the recommended measurement condition is at least one of a wavelength range of light to be used for measurement of the spectroscopic analysis spectrum, a sampling interval of a wavelength of the light, a slit width of a diffraction grating of a spectroscope that disperses the light, or a sweep speed of the wavelength of the light.