公开(公告)号：US11835412B2

公开(公告)日：2023-12-05

申请号：US17345354

申请日：2021-06-11

Applicant: Hitachi, Ltd.

Inventor： Hiroyuki Yoshimoto ,  Ryotaro Kawahara ,  Ryohei Matsui ,  Nobuyuki Sugii ,  Tsuneya Kurihara ,  Hirohiko Sagawa ,  Naoko Ushio ,  Motoki Tajima ,  Shingo Kirita

IPC: G01L5/16 ,  G01B7/16 ,  G01L5/00

CPC classification number: G01L5/16 ,  G01B7/18 ,  G01L5/0095

Abstract: Provided is a digitalization system capable of digitalizing the skills of delicate work. This digitalization system comprises a first sensor mounted on a work tool and which detects a deformation of the work tool when the work tool is pressed against a work target, a second sensor which detects a force applied to the work target or a force applied to the work tool when the work tool is pressed against the work target, and a computer which calculates an angle of a corner formed with the work tool and the work target based on sensor values acquired with the first sensor, and calculates a force applied to the work target when the work tool is pressed against the work target based on sensor values acquired with the second sensor.

公开(公告)号：US10948904B1

公开(公告)日：2021-03-16

申请号：US16817839

申请日：2020-03-13

Applicant: Hitachi, Ltd.

Inventor： Hiroyuki Yoshimoto ,  Naoko Ushio ,  Ryohei Matsui ,  Hiroki Ohashi ,  Toshinari Ishii ,  Daiji Iwasa

IPC: G06Q30/00 ,  G05B19/418 ,  G06T7/00 ,  H04N7/18

Abstract: The product inspection system comprises an inspection information collecting unit which collects inspection information acquired from an inspection target, an inspection time acquisition unit which acquires an inspection time that the inspection information was acquired, a recording unit which mutually associates and records the inspection information collected by the inspection information collecting unit and the inspection time acquired by the inspection time acquisition unit, and a display control unit which displays the inspection information recorded in the recording unit on a display terminal.

公开(公告)号：US11156650B2

公开(公告)日：2021-10-26

申请号：US16446907

申请日：2019-06-20

Applicant: HITACHI, LTD.

Inventor： Ryohei Matsui ,  Nobuyuki Sugii ,  Tetsufumi Kawamura

IPC: G01R31/01 ,  G01N19/08 ,  G01R31/28 ,  G01H1/04 ,  G01H1/00

Abstract: One preferable aspect of the present invention is a state detecting system which detects a state of a machine device based on a detection signal from a detecting element provided to the machine device, and is the state detecting system which includes a non-normal time rate detecting unit which detects a rate or a value as a non-normal time rate, the rate being a rate of an integration value of a time during which an amplitude of the detection signal exceeds a predetermined normal amplitude within a predetermined time, and the value being physically equivalent to the rate.