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1.发明公开公开(公告)号：US20240151956A1
公开(公告)日：2024-05-09
申请号：US18281649
申请日：2022-01-17
发明人： Toshiki YAMADA , Takashi MIHOYA
IPC分类号： G02B21/00
CPC分类号： G02B21/0032 , G02B21/0048 , G02B21/008
摘要： A confocal microscope unit includes: a light source device which includes a light emitting element, a photodetector, a drive unit, and a control unit; and a scan mirror which scans excitation light, wherein, the control unit executes first control of adjusting and outputting a drive signal for driving the drive unit based on a control signal and a detection signal from the photodetector and executes the first control while changing a value of the control signal to generate and store a data table indicating a correspondence between a drive current and light intensity of excitation light, and wherein, the control unit executes second control of outputting the control signal as a drive signal, executes the second control by using the control signal corresponding to the drive current corresponding to the target light intensity based on the data table, and executes control of stopping the drive current.
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2.发明公开公开(公告)号：US20240231067A9
公开(公告)日：2024-07-11
申请号：US18279098
申请日：2022-01-12
IPC分类号： G02B21/00
CPC分类号： G02B21/0048 , G02B21/008
摘要： A scanning microscope unit includes: a light source for outputting irradiation light; a photodetector; a MEMS mirror for scanning an irradiation light over an observation object, and for guiding an observation light toward the photodetector; a scanning lens for guiding the irradiation light scanned by the MEMS mirror, to a microscope optical system, and for guiding the observation light imaged by the microscope optical system, to the MEMS mirror; and a frame member formed in a frame shape to define an opening, and disposed on a side of the microscope optical system with respect to the scanning lens such that the irradiation light and the observation light pass through the opening. The frame member includes a calibration portion provided in a side portion defining the opening, and for generating calibration light including a sensitivity wavelength of the photodetector in response to an incidence of the irradiation light.
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3.发明公开公开(公告)号：US20240134177A1
公开(公告)日：2024-04-25
申请号：US18279098
申请日：2022-01-12
IPC分类号： G02B21/00
CPC分类号： G02B21/0048 , G02B21/008
摘要： A scanning microscope unit includes: a light source for outputting irradiation light; a photodetector; a MEMS mirror for scanning an irradiation light over an observation object, and for guiding an observation light toward the photodetector; a scanning lens for guiding the irradiation light scanned by the MEMS mirror, to a microscope optical system, and for guiding the observation light imaged by the microscope optical system, to the MEMS mirror; and a frame member formed in a frame shape to define an opening, and disposed on a side of the microscope optical system with respect to the scanning lens such that the irradiation light and the observation light pass through the opening. The frame member includes a calibration portion provided in a side portion defining the opening, and for generating calibration light including a sensitivity wavelength of the photodetector in response to an incidence of the irradiation light.
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