公开(公告)号：US06441632B1

公开(公告)日：2002-08-27

申请号：US09681450

申请日：2001-04-09

Applicant: George C. Correia ,  Howard F. Garcia

Inventor： George C. Correia ,  Howard F. Garcia

IPC: G01R3102

CPC classification number: G01R1/0483

Abstract: A spring probe (pogo pin) contactor for testing semiconductor devices with pogo pins within a spring probe contactor is disclosed. The contactor device has a plurality of pogo pins extending therefrom for testing the semiconductor device. A surface of the spring pogo pin contactor has an array of apertures for receiving each pogo pin for contacting of the plurality of contacts on the device under test in order to make contact with and compress the pogo pins. A three piece assembly is used to accurately position the pogo pins for ease of construction and repair.

Abstract translation: 公开了一种用于在弹簧探针接触器内测试具有弹簧销的半导体器件的弹簧探针（弹簧针）接触器。 接触器装置具有从其延伸的多个弹簧针，用于测试半导体器件。 弹簧弹簧针接触器的表面具有用于接收每个弹簧销的孔阵列，用于接触待测器件上的多个触点，以便与弹簧销接触并压缩弹簧销。 使用三件式组件来精确定位弹簧销，以方便施工和维修。