公开(公告)号：US20240077438A1

公开(公告)日：2024-03-07

申请号：US18506331

申请日：2023-11-10

Applicant: GENERAL ELECTRIC COMPANY ,  Bruker Nano GmbH

Inventor： Richard DiDomizio ,  Michael Christopher Andersen ,  Walter Vincent Dixon, III ,  Timothy Hanlon ,  Wayne Lee Lawrence ,  Ramkumar Kashyap Oruganti ,  Jonathan Rutherford Owens ,  Daniel M. Ruscitto ,  Adarsh Shukla ,  Eric John Telfeyan ,  Gregory Donald Crim ,  Michael Wylie Krauss ,  André Dziurla ,  Sven Martin Joachim Larisch ,  Falk Reinhardt ,  Roald Alberto Tagle Berdan ,  Henning Schroeder

IPC: G01N23/223 ,  G01N35/00

CPC classification number: G01N23/223 ,  G01N35/0099

Abstract: An apparatus and method for an inspection apparatus for inspecting a component. The inspection apparatus including a robotic arm. A micro-XRF instrument having an instrument head coupled to the robotic arm. A seat supporting the component within a scanning area during inspection; and a computer in communication with the robotic arm and the micro-XRF instrument.

公开(公告)号：US11507616B2

公开(公告)日：2022-11-22

申请号：US17011912

申请日：2020-09-03

Applicant: General Electric Company

Inventor： Shaopeng Liu ,  Xiao Bian ,  Yan Liu ,  Feng Xue ,  Walter Vincent Dixon, III ,  Mark Richard Gilder ,  Peihong Zhu ,  Bernard Patrick Bewlay ,  Byron Andrew Pritchard ,  Masako Yamada ,  Colin James Parris

IPC: G06F16/583 ,  G06N3/04 ,  G06F16/14 ,  G06F16/51

Abstract: A method of inspecting a component includes storing at least one inspection image file in a memory and receiving a search request associated with the at least one inspection image file. The method also includes accessing a database including a plurality of image files, comparing the hash code of the at least one inspection image file to the hash code of each image file of the plurality of image files, and identifying a first subset of image files based on the hash code comparison. The method also includes comparing the feature data of the at least one inspection image file to the feature data of each image file of the first subset of image files and classifying a second subset of image files as relevant based on the feature data comparison. The method further includes generating search results based on the second subset of image files.

公开(公告)号：US20220067083A1

公开(公告)日：2022-03-03

申请号：US17011912

申请日：2020-09-03

Applicant: General Electric Company

Inventor： Shaopeng Liu ,  Xiao Bian ,  Yan Liu ,  Feng Xue ,  Walter Vincent Dixon, III ,  Mark Richard Gilder ,  Peihong Zhu ,  Bernard Patrick Bewlay ,  Byron Andrew Pritchard ,  Masako Yamada ,  Colin James Parris

IPC: G06F16/583 ,  G06F16/51 ,  G06F16/14 ,  G06N3/04

Abstract: A method of inspecting a component includes storing at least one inspection image file in a memory and receiving a search request associated with the at least one inspection image file. The method also includes accessing a database including a plurality of image files, comparing the hash code of the at least one inspection image file to the hash code of each image file of the plurality of image files, and identifying a first subset of image files based on the hash code comparison. The method also includes comparing the feature data of the at least one inspection image file to the feature data of each image file of the first subset of image files and classifying a second subset of image files as relevant based on the feature data comparison. The method further includes generating search results based on the second subset of image files.