公开(公告)号：US20240077438A1

公开(公告)日：2024-03-07

申请号：US18506331

申请日：2023-11-10

Applicant: GENERAL ELECTRIC COMPANY ,  Bruker Nano GmbH

Inventor： Richard DiDomizio ,  Michael Christopher Andersen ,  Walter Vincent Dixon, III ,  Timothy Hanlon ,  Wayne Lee Lawrence ,  Ramkumar Kashyap Oruganti ,  Jonathan Rutherford Owens ,  Daniel M. Ruscitto ,  Adarsh Shukla ,  Eric John Telfeyan ,  Gregory Donald Crim ,  Michael Wylie Krauss ,  André Dziurla ,  Sven Martin Joachim Larisch ,  Falk Reinhardt ,  Roald Alberto Tagle Berdan ,  Henning Schroeder

IPC: G01N23/223 ,  G01N35/00

CPC classification number: G01N23/223 ,  G01N35/0099

Abstract: An apparatus and method for an inspection apparatus for inspecting a component. The inspection apparatus including a robotic arm. A micro-XRF instrument having an instrument head coupled to the robotic arm. A seat supporting the component within a scanning area during inspection; and a computer in communication with the robotic arm and the micro-XRF instrument.