Invention Grant
- Patent Title: Inspection systems and methods including image retrieval module
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Application No.: US17011912Application Date: 2020-09-03
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Publication No.: US11507616B2Publication Date: 2022-11-22
- Inventor: Shaopeng Liu , Xiao Bian , Yan Liu , Feng Xue , Walter Vincent Dixon, III , Mark Richard Gilder , Peihong Zhu , Bernard Patrick Bewlay , Byron Andrew Pritchard , Masako Yamada , Colin James Parris
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Fitch, Even, Tabin & Flannery LLP
- Main IPC: G06F16/583
- IPC: G06F16/583 ; G06N3/04 ; G06F16/14 ; G06F16/51

Abstract:
A method of inspecting a component includes storing at least one inspection image file in a memory and receiving a search request associated with the at least one inspection image file. The method also includes accessing a database including a plurality of image files, comparing the hash code of the at least one inspection image file to the hash code of each image file of the plurality of image files, and identifying a first subset of image files based on the hash code comparison. The method also includes comparing the feature data of the at least one inspection image file to the feature data of each image file of the first subset of image files and classifying a second subset of image files as relevant based on the feature data comparison. The method further includes generating search results based on the second subset of image files.
Public/Granted literature
- US20220067083A1 INSPECTION SYSTEMS AND METHODS INCLUDING IMAGE RETRIEVAL MODULE Public/Granted day:2022-03-03
Information query