Microtomic System and Process Utilizing Electrostatic Force to Handle Sample Sections
    4.
    发明申请
    Microtomic System and Process Utilizing Electrostatic Force to Handle Sample Sections 有权
    透视系统和利用静电力处理样品部分的工艺

    公开(公告)号:US20160320270A1

    公开(公告)日:2016-11-03

    申请号:US15208940

    申请日:2016-07-13

    发明人: Zhongwei Chen

    IPC分类号: G01N1/06 B26D7/18 G01N1/28

    摘要: Provided is a process of using a microtomic system for the preparation of sections for microscope examination. A cutting edge in the system can cut through a sample block and produce a section one end of which remains attached to the cutting edge. A voltage generator can generate a voltage and apply the voltage between the cutting edge and a section receiver such as a semiconductor chip grid. Through electrostatic force caused by the voltage, another end of the section can anchor to the section receiver. The section is then spread on the receiver. The system is automatable, highly efficient, and does not need liquid to float sample sections, and can therefore maintain the integration of the sample sections.

    摘要翻译: 提供了使用显微镜系统来制备用于显微镜检查的切片的过程。 系统中的切割边缘可以切割出样品块,并产生其一端保持附着到切割边缘的部分。 电压发生器可以产生电压并且在切割边缘和诸如半导体芯片格栅之类的部分接收器之间施加电压。 通过由电压引起的静电力,该部分的另一端可以锚定到部分接收器。 然后将该部分扩展到接收器。 该系统是可自动化,高效率的,并且不需要液体漂浮样品部分,因此可以保持样品部分的集成。