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公开(公告)号：US20190257877A1
公开(公告)日：2019-08-22
申请号：US16321984
申请日：2017-07-14
Applicant: Endress+Hauser Flowtec AG
Inventor： Thomas Böhler , Matthias Brudermann , Christoph Werle , Markus Wucher , Daniel Kollmer , Ludovic Adam
Abstract: Disclosed is a test system for testing electric connections, in particular soldered connections, between electronic components and a printed circuit board to be tested, characterized in that the test system includes a subassembly, which is movably mounted in a housing of the test system, and a current and/or voltage source for energizing the circuit board to be tested, the current and/or voltage source being arranged in the housing of the test system in such a way as to be movable in at least two directions in space.
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公开(公告)号：US10884052B2
公开(公告)日：2021-01-05
申请号：US16321984
申请日：2017-07-14
Applicant: Endress+Hauser Flowtec AG
Inventor： Thomas Böhler , Matthias Brudermann , Christoph Werle , Markus Wucher , Daniel Kollmer , Ludovic Adam
Abstract: Disclosed is a test system for testing electric connections, in particular soldered connections, between electronic components and a printed circuit board to be tested, characterized in that the test system includes a subassembly, which is movably mounted in a housing of the test system, and a current and/or voltage source for energizing the circuit board to be tested, the current and/or voltage source being arranged in the housing of the test system in such a way as to be movable in at least two directions in space.
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3.发明申请公开(公告)号：US20190265290A1
公开(公告)日：2019-08-29
申请号：US16321961
申请日：2017-07-14
Applicant: Endress+Hauser Flowtec AG
Inventor： Thomas Böhler , Matthias Brudermann , Christoph Werle , Markus Wucher , Daniel Kollmer , Ludovic Adam
Abstract: A test system (1) for testing electric connections, in particular soldered connections, between electronic components and a printed circuit board (6) to be tested, characterized in that the test system (1) includes a subassembly, which is movably mounted in a housing (1a) of the test system, and a current and/or voltage source (14) for energizing the circuit board (6) to be tested, the current and/or voltage source (14) being arranged in the housing (1a) of the test system (1) in such a way as to be movable in at least two directions in space.
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公开(公告)号：US10989766B2
公开(公告)日：2021-04-27
申请号：US16321885
申请日：2017-07-03
Applicant: Endress+Hauser Flowtec AG
Inventor： Thomas Böhler , Matthias Brudermann , Christoph Werle , Markus Wucher , Daniel Kollmer , Ludovic Adam
Abstract: A test system for checking electrical connections, especially solder connections, between electronic components with a circuit board to be checked, characterized in that the test system includes a communication interface with at least three electrically-conductive contact tips, which by contact with a contacting arrangement on the circuit board having a number of contacting locations enable a data exchange with a data memory and/or a communication module of a circuit board, wherein the data exchange occurs according to a communication protocol.
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5.发明申请公开(公告)号：US20190277903A1
公开(公告)日：2019-09-12
申请号：US16321925
申请日：2017-07-14
Applicant: Endress+Hauser Flowtec AG
Inventor： Thomas Böhler , Matthias Brudermann , Christoph Werle , Markus Wucher , Daniel Kollmer , Ludovic Adam
Abstract: A test system for testing electrical connections, especially soldered connections, between electronic components and a circuit board to be tested, characterized in that the test system has a communication interface, which by contacting the circuit board enables a data exchange with a data memory or a communication module of the circuit board to be tested, wherein the communication interface is arranged within a housing of the test system freely movably in at least two spatial directions, preferably three spatial directions.
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Patent Agency Ranking
6.发明申请公开(公告)号：US20170199231A1
公开(公告)日：2017-07-13
申请号：US15315034
申请日：2015-05-27
Applicant: Endress + Hauser Flowtec AG
Inventor： Adrian Brunner , Matthias Brudermann , Christoph Werle
CPC classification number: G01R15/183 , H01H47/001 , H01H47/002 , H01H47/32 , H01H47/325 , H01H50/18 , H01H50/44 , H01H2047/009
Abstract: A coil arrangement comprises an electrical coil and an armature movable between a first end position (I) and a second end position, an electronic switch switchable between at least two switch states, a control and monitoring circuit for producing a switching signal actuating the electronic switch and an operating circuit for providing an operating voltage and an electrical current measurement signal representing an electrical current flowing as a function of time in a coil electrical current circuit formed with the coil. The control and monitoring circuit is additionally adapted using the electrical current measurement signal to perform a checking of the coil, for example, namely to detect, whether an inductance, of the coil has a dependence on the switching signal as a function of time, respectively a behavior as a function of time corresponding with the switching signal as a function of time. The electromechanical switch, in turn, comprises a first switch contact movable between a first switch position and a second switch position, a second switch contact and, for actuating the switch contact, a coil arrangement of the invention, while the measurement transmitter comprises, besides such an electromechanical switch, also a measuring circuit for receiving at least one transducer signal dependent on a physical or chemical, measured variable and/or representing the measured variable as a function of time.
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公开(公告)号：US11002785B2
公开(公告)日：2021-05-11
申请号：US16321869
申请日：2017-07-03
Applicant: Endress+Hauser Flowtec AG
Inventor： Thomas Böhler , Matthias Brudermann , Christoph Werle , Markus Wucher , Daniel Kollmer , Ludovic Adam
Abstract: A circuit board comprising a contacting arrangement, including three metal contacting regions, which are connected with one or more data links of the circuit board and in the case of contact with a communication interface of a test system enable a data exchange with a data memory of a circuit board.
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8.发明申请公开(公告)号：US20190265289A1
公开(公告)日：2019-08-29
申请号：US16321885
申请日：2017-07-03
Applicant: Endress+Hauser Flowtec AG
Inventor： Thomas Böhler , Matthias Brudermann , Christoph Werle , Markus Wucher , Daniel Kollmer , Ludovic Adam
Abstract: A test system for checking electrical connections, especially solder connections, between electronic components with a circuit board to be checked, characterized in that the test system includes a communication interface with at least three electrically-conductive contact tips, which by contact with a contacting arrangement on the circuit board having a number of contacting locations enable a data exchange with a data memory and/or a communication module of a circuit board, wherein the data exchange occurs according to a communication protocol.
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公开(公告)号：US20190235015A1
公开(公告)日：2019-08-01
申请号：US16321869
申请日：2017-07-03
Applicant: Endress+Hauser Flowtec AG
Inventor： Thomas Böhler , Matthias Brudermann , Christoph Werle , Markus Wucher , Daniel Kollmer , Ludovic Adam
CPC classification number: G01R31/2818 , G01R31/043 , G01R31/048 , H05K1/0268 , H05K2201/09927 , H05K2203/162
Abstract: A circuit board comprising a contacting arrangement, including three metal contacting regions, which are connected with one or more data links of the circuit board and in the case of contact with a communication interface of a test system enable a data exchange with a data memory of a circuit board.
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10.发明授权公开(公告)号：US10955492B2
公开(公告)日：2021-03-23
申请号：US16321961
申请日：2017-07-14
Applicant: Endress+Hauser Flowtec AG
Inventor： Thomas Böhler , Matthias Brudermann , Christoph Werle , Markus Wucher , Daniel Kollmer , Ludovic Adam
Abstract: A test system for testing electric connections, in particular soldered connections, between electronic components and a printed circuit board to be tested, characterized in that the test system includes a subassembly, which is movably mounted in a housing of the test system, and a current and/or voltage source for energizing the circuit board to be tested, the current and/or voltage source being arranged in the housing of the test system in such a way as to be movable in at least two directions in space.
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