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1.发明授权公开(公告)号：US09170223B2
公开(公告)日：2015-10-27
申请号：US13780166
申请日：2013-02-28
Inventor： Younghoon Hyun , Young Sam Park , Moon Gyu Jang , Taehyoung Zyung
CPC classification number: G01N25/18
Abstract: The inventive concept relates to a thermal conductivity measuring device and a method of measuring the thermal conductivity. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.
Abstract translation: 本发明的概念涉及热导率测量装置和测量热导率的方法。 热导率测量装置可以包括连接到样品的一个侧端并从热源接收热量的第一结构; 连接到样品的另一侧端的第二结构; 连接到第一结构的第一级，同时支撑第一结构; 在支撑所述第二结构的同时连接到所述第二结构的第二级; 连接单元，连接在第一阶段和第二阶段之间; 以及测量单元，测量第一和第二结构以及第一和第二阶段的温度。 由于考虑到测量环境，本发明概念的热导率测量校正了由于从载台发射的热传递引起的级的温度变化，所以可以提高测量的可靠性。
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公开(公告)号：US09631981B2
公开(公告)日：2017-04-25
申请号：US14330621
申请日：2014-07-14
Inventor： Dong Suk Jun , Moon Gyu Jang , Won Chul Choi
Abstract: Provided is an apparatus for measuring a thermoelectric device. The apparatus includes a high temperature heater controlling a temperature of a first side of a sample, a low temperature heater controlling a temperature of a second side of the sample, a fine control heater controlling the temperature of the first side of the sample by a smaller unit than the high temperature heater, a temperature control and voltage measuring unit controlling the high temperature heater, the low temperature heater, and the fine control heater and measuring voltages of the first and second sides of the sample, and a thermal conductivity measuring unit measuring thermal conductivity of the sample by using a high temperature output voltage generated in the first side of the sample and a low temperature output voltage generated in the second side of the sample.
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Patent Agency Ranking
3.发明申请公开(公告)号：US20140010258A1
公开(公告)日：2014-01-09
申请号：US13780166
申请日：2013-02-28
Inventor： Younghoon Hyun , Young Sam Park , Moon Gyu Jang , Taehyoung Zyung
IPC: G01N25/18
CPC classification number: G01N25/18
Abstract: The inventive concept relates to a thermal conductivity measuring device and a method of measuring the thermal conductivity. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.
Abstract translation: 本发明的概念涉及热导率测量装置和测量热导率的方法。 热导率测量装置可以包括连接到样品的一个侧端并从热源接收热量的第一结构; 连接到样品的另一侧端的第二结构; 连接到第一结构的第一级，同时支撑第一结构; 在支撑所述第二结构的同时连接到所述第二结构的第二级; 连接单元，连接在第一阶段和第二阶段之间; 以及测量单元，测量第一和第二结构以及第一和第二阶段的温度。 由于考虑到测量环境，本发明概念的热导率测量校正了由于从载台发射的热传递引起的级的温度变化，所以可以提高测量的可靠性。
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公开(公告)号：US09437795B2
公开(公告)日：2016-09-06
申请号：US14731989
申请日：2015-06-05
Inventor： Dong Suk Jun , Moon Gyu Jang , Won Chul Choi
Abstract: Provided are a thermoelectric device and a method of manufacturing the same. The method may include forming nanowires on a substrate, forming a barrier layer on the nanowires, forming a bulk layer on the barrier layer, forming a lower electrode under the substrate, and forming an upper electrode on the bulk layer.
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公开(公告)号：US09377421B2
公开(公告)日：2016-06-28
申请号：US14862678
申请日：2015-09-23
Inventor： Younghoon Hyun , Young Sam Park , Moon Gyu Jang , Taehyoung Zyung
CPC classification number: G01N25/18
Abstract: The inventive concept relates to a thermal conductivity measuring device and a method of measuring the thermal conductivity. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.
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公开(公告)号：US09377420B2
公开(公告)日：2016-06-28
申请号：US14861909
申请日：2015-09-22
Inventor： Younghoon Hyun , Young Sam Park , Moon Gyu Jang , Taehyoung Zyung
CPC classification number: G01N25/18
Abstract: The inventive concept relates to a thermal conductivity measuring device. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.
Abstract translation: 本发明的概念涉及热导率测量装置。 热导率测量装置可以包括连接到样品的一个侧端并从热源接收热量的第一结构; 连接到样品的另一侧端的第二结构; 连接到第一结构的第一级，同时支撑第一结构; 在支撑所述第二结构的同时连接到所述第二结构的第二级; 连接单元，连接在第一阶段和第二阶段之间; 以及测量单元，测量第一和第二结构以及第一和第二阶段的温度。 由于考虑到测量环境，本发明概念的热导率测量校正了由于从载台发射的热传递引起的级的温度变化，所以可以提高测量的可靠性。
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公开(公告)号：US09082895B2
公开(公告)日：2015-07-14
申请号：US14329348
申请日：2014-07-11
Inventor： Dong Suk Jun , Moon Gyu Jang , Won Chul Choi
Abstract: Provided are a thermoelectric device and a method of manufacturing the same. The method may include forming nanowires on a substrate, forming a barrier layer on the nanowires, forming a bulk layer on the barrier layer, forming a lower electrode under the substrate, and forming an upper electrode on the bulk layer.
Abstract translation: 提供一种热电装置及其制造方法。 该方法可以包括在衬底上形成纳米线，在纳米线上形成阻挡层，在阻挡层上形成体层，在衬底下方形成下电极，在体层上形成上电极。
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