公开(公告)号：US20240304479A1

公开(公告)日：2024-09-12

申请号：US18369784

申请日：2023-09-18

申请人： Diodes Incorporated

发明人： WanHui Li ,  JiaWei Tai

IPC分类号： H01L21/67 ,  H01L21/673

CPC分类号： H01L21/67276 ,  H01L21/67333

摘要： A method for calibrating a tray shield used for holding a wafer for processing is provided. The tray shield is in a ring shape. The method includes determining whether a first calibration ring is placeable into an inner chamber of the tray shield. When the first calibration ring is placeable into the inner chamber, the tray shield is determined to be usable for wafer processing. The first calibration ring is moved around inside the inner chamber to remove metal particles or burrs on the inner chamber, and thereafter, a wafer is loaded in the inner chamber. When the first calibration ring is not placeable into the inner chamber, the tray shield may be discarded. The method may also include assembling the tray shield utilizing a second calibration ring having an outer diameter equal to an inner diameter of the ring shape.