CHARGED PARTICLE SCANNERS
    1.
    发明申请

    公开(公告)号:US20200335299A1

    公开(公告)日:2020-10-22

    申请号:US16853529

    申请日:2020-04-20

    摘要: A volume interrogation system can use an accelerated beam of charged particles to interrogate objects using charged-particle attenuation and scattering tomography to screen items such as electronic devices, packages, baggage, industrial products, or food products for the presence of materials of interest inside. The apparatus, systems, and methods in this patent document can be employed in checkpoint applications to scan items. Such checkpoint applications can include border crossings, mass transit terminals (subways, buses, railways, ferries, etc.), and government and private-sector facilities.

    Charged particle scanners
    2.
    发明授权

    公开(公告)号:US11152190B2

    公开(公告)日:2021-10-19

    申请号:US16853529

    申请日:2020-04-20

    摘要: A volume interrogation system can use an accelerated beam of charged particles to interrogate objects using charged-particle attenuation and scattering tomography to screen items such as electronic devices, packages, baggage, industrial products, or food products for the presence of materials of interest inside. The apparatus, systems, and methods in this patent document can be employed in checkpoint applications to scan items. Such checkpoint applications can include border crossings, mass transit terminals (subways, buses, railways, ferries, etc.), and government and private-sector facilities.

    Charged particle scanners
    3.
    发明授权

    公开(公告)号:US11614552B2

    公开(公告)日:2023-03-28

    申请号:US16853520

    申请日:2020-04-20

    摘要: A volume interrogation system can use an accelerated beam of charged particles to interrogate objects using charged-particle attenuation and scattering tomography to screen items such as portable electronic devices, packages, baggage, industrial products, or food products for the presence of materials of interest inside. The exemplary systems and methods in this patent document can be employed in checkpoint applications to scan items. Such checkpoint applications can include border crossings, mass transit terminals (subways, buses, railways, ferries, etc.), and government and private-sector facilities.

    CHARGED PARTICLE SCANNERS
    5.
    发明申请

    公开(公告)号:US20200333482A1

    公开(公告)日:2020-10-22

    申请号:US16853520

    申请日:2020-04-20

    IPC分类号: G01T5/08 H04N5/32

    摘要: A volume interrogation system can use an accelerated beam of charged particles to interrogate objects using charged-particle attenuation and scattering tomography to screen items such as portable electronic devices, packages, baggage, industrial products, or food products for the presence of materials of interest inside. The exemplary systems and methods in this patent document can be employed in checkpoint applications to scan items. Such checkpoint applications can include border crossings, mass transit terminals (subways, buses, railways, ferries, etc.), and government and private-sector facilities.