Automated ion optics charging compensation

    公开(公告)号:US11887831B2

    公开(公告)日:2024-01-30

    申请号:US17312695

    申请日:2019-12-12

    CPC classification number: H01J49/067 H01J49/0031 H01J49/4215

    Abstract: In some embodiments, a method for optimizing performance of a mass spectrometer comprises using an ion source to generate ions, collisionally cooling the ions within an ion guide, directing said ions from the ion guide through at least one ion lens to a downstream mass analyzer, ramping a DC voltage applied to the ion lens, performing a mass analysis of the ions within the mass analyzer while the DC voltage applied to the ion lens is ramped, estimating performance of the mass spectrometer by measuring one or more characteristics of at least one of an ion signal and the voltage ramp, and adjusting a DC voltage applied to said at least one lens element based on said measured one or more characteristics of at least one of the ion signal and the voltage ramp so as to enhance performance of the mass spectrometer.

    ELECTROSPRAY PROBE
    3.
    发明申请

    公开(公告)号:US20220157592A1

    公开(公告)日:2022-05-19

    申请号:US17440131

    申请日:2020-05-29

    Abstract: An electrospray probe for use in an electrospray ion source is disclosed, which comprises a cannula extending from a proximal end having an inlet aperture for receiving a liquid sample containing at least one analyte to a discharge emitter end having an outlet aperture through which charged liquid droplets containing ions of said analyte are discharged, and an electrically conductive coating covering at least a portion of an external surface and at least a portion of an internal surface of said emitter end.

    AUTOMATED METHOD PARAMETER CONFIGURATION FOR DIFFERENTIAL MOBILITY SPECTROMETRY SEPARATIONS

    公开(公告)号:US20240186130A1

    公开(公告)日:2024-06-06

    申请号:US18554840

    申请日:2022-04-14

    CPC classification number: H01J49/0031 H01J49/004 H01J49/0431

    Abstract: Systems and methods are disclosed for automated method parameter configuration for differential mobility separations. As non-limiting examples, various aspects of this disclosure provide receiving a sample in an open port interface; transferring the sample to an ionization source; ionizing the transferred sample; introducing the ionized sample into a mass spectrometer; mass analyzing the ionized sample to produce an initial mass analysis result; determining a peak width of the initial mass analysis result; and determining a dwell time for subsequent measurements based on the determined peak width, a pre-defined number of data points across subsequent mass analysis peak widths, and a number of different analytes to be assessed for the sample. The sample may be diluted and transferred to the ionization source by a sample introduction apparatus selected from a group including an acoustic droplet ejector (ADE), a pneumatic ejector, a piezoelectric ejector, and a hydraulic ejector.

    Electrospray probe
    6.
    发明授权

    公开(公告)号:US12224171B2

    公开(公告)日:2025-02-11

    申请号:US17440131

    申请日:2020-05-29

    Abstract: An electrospray probe for use in an electrospray ion source is disclosed, which comprises a cannula extending from a proximal end having an inlet aperture for receiving a liquid sample containing at least one analyte to a discharge emitter end having an outlet aperture through which charged liquid droplets containing ions of said analyte are discharged, and an electrically conductive coating covering at least a portion of an external surface and at least a portion of an internal surface of said emitter end.

    Automated Ion Optics Charging Compensation

    公开(公告)号:US20220059334A1

    公开(公告)日:2022-02-24

    申请号:US17312695

    申请日:2019-12-12

    Abstract: In some embodiments, a method for optimizing performance of a mass spectrometer comprises using an ion source to generate ions, collisionally cooling the ions within an ion guide, directing said ions from the ion guide through at least one ion lens to a downstream mass analyzer, ramping a DC voltage applied to the ion lens, performing a mass analysis of the ions within the mass analyzer while the DC voltage applied to the ion lens is ramped, estimating performance of the mass spectrometer by measuring one or more characteristics of at least one of an ion signal and the voltage ramp, and adjusting a DC voltage applied to said at least one lens element based on said measured one or more characteristics of at least one of the ion signal and the voltage ramp so as to enhance performance of the mass spectrometer.

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