公开(公告)号：US20240295440A1

公开(公告)日：2024-09-05

申请号：US18661379

申请日：2024-05-10

Applicant: California Institute of Technology

Inventor： Axel SCHERER ,  Paromita MITCHELL ,  John Richard ORDONEZ-VARELA ,  Jack JEWELL

IPC: G01J5/24 ,  G01J5/00 ,  G01J5/08 ,  G01J5/20 ,  G01J5/48

CPC classification number: G01J5/24 ,  G01J5/0896 ,  G01J5/485 ,  G01J2005/0077 ,  G01J2005/204

Abstract: A temperature monitoring system includes a semiconductor member mounted onto the surface of an object having a surface whose temperature is to be monitored. The semiconductor member has a temperature-dependent bandgap with an absorption edge that varies with temperature. A light source is configured to illuminate the semiconductor member with monochromatic light. The monochromatic light has a wavelength equal to an absorption edge wavelength that is associated with the absorption edge when the semiconductor member is at a specified temperature. An imaging device is configured to receive light reflected from the semiconductor member when illuminated with the monochromatic light such that a surface temperature of the object is at the specified temperature when a change in an amount of reflected light that is received indicates that the wavelength of the monochromatic light is equal to the absorption edge wavelength at the specified temperature.

公开(公告)号：US20240110837A1

公开(公告)日：2024-04-04

申请号：US18376582

申请日：2023-10-04

Applicant: California Institute of Technology ,  TotalEnergies OneTech

Inventor： Axel SCHERER ,  Jack JEWELL ,  John Richard ORDONEZ-VARELA ,  Paromita MITCHELL

IPC: G01K11/125

CPC classification number: G01K11/125

Abstract: A temperature monitoring system includes a semiconductor member mounted onto the surface of an object having a surface whose temperature is to be monitored. The semiconductor member has a temperature-dependent bandgap with an absorption edge that varies with temperature. A light source is configured to illuminate the semiconductor member with monochromatic light. The monochromatic light has a wavelength equal to an absorption edge wavelength that is associated with the absorption edge when the semiconductor member is at a specified temperature. A detector is configured to receive light reflected from the semiconductor member when illuminated with the monochromatic light such that a surface temperature of the object is at the specified temperature when a change in an amount of reflected light that is received indicates that the wavelength of the monochromatic light is equal to the absorption edge wavelength at the specified temperature.