公开(公告)号：US20230333294A1

公开(公告)日：2023-10-19

申请号：US18134295

申请日：2023-04-13

Applicant: California Institute of Technology

Inventor： Axel Scherer, Ph.D. ,  Jack Jewell ,  Taeyoon Jeon

IPC: G02B5/08 ,  G02B5/20

CPC classification number: G02B5/0816 ,  G02B5/208

Abstract: The present disclosure is directed toward the simultaneous formation of a plurality of optical elements on a common substrate, where each optical element includes at least one layer having a desired non-uniform-thickness variation. Each such layer is formed such that it includes a plurality of material patterns characterized by the non-uniform thickness variation, where each material pattern is disposed on a different deposition site on the substrate. The material patterns are configured such that adjacent optical elements are separated by a boundary region for facilitating dicing of the substrate into individual optical elements. The non-uniform-thickness layer is formed by direct deposition through a shadow mask that includes a plurality of mask patterns that are either (1) configured to pass material flux in a non-uniform manner or (2) configured to shadow different portions of their respective deposition regions while being moved relative to the substrate.

公开(公告)号：US20230152211A1

公开(公告)日：2023-05-18

申请号：US17984177

申请日：2022-11-09

Applicant: California Institute of Technology

Inventor： Jack Jewell ,  Axel Scherer, Ph.D. ,  Amirhossein Nateghi ,  Taeyoon Jeon

IPC: G01N21/03 ,  G01N1/44 ,  G01N21/25 ,  G01N21/35

CPC classification number: G01N21/0303 ,  G01N1/44 ,  G01N21/35 ,  G01N21/255

Abstract: The present disclosure is directed toward measurement systems capable of optical analysis of a test sample. Embodiments in accordance with the present disclosure include a sample holder having a plurality of projections that extend from a planar surface, where the projections and planar surface collectively define an open sample-collection surface that enables an interrogation signal direct access to the test sample. The projections can be dimensioned and arranged to collectively define a geometric anti-reflection surface that is substantially non-reflective for the interrogation signal even at large angles of incidence. In some embodiments, the sample holder is configured as a reflective element that enables multiple passes of the interrogation signal through the test sample. In some embodiments, the sample holder is configured as a transmissive element. In some embodiments, the projections themselves are reflective.