公开(公告)号：US20220349811A1

公开(公告)日：2022-11-03

申请号：US17864246

申请日：2022-07-13

Applicant: California Institute of Technology

Inventor： Axel Scherer, Ph.D. ,  Amirhossein Nateghi ,  Taeyoon Jeon

IPC: G01N21/03 ,  G01N1/42 ,  G01N1/44 ,  G01N21/17 ,  G01N21/25 ,  G01N21/35

Abstract: The present disclosure is directed toward a measurement system capable of rapid spectroscopic and calorimetric analysis of the chemical makeup of a test sample. Systems in accordance with the present disclosure include a low-thermal-mass sample holder having a substrate whose surface has been engineered to create a large-area sample-collection surface. The sample holder includes an integrated temperature controller that can rapidly heat or cool the test sample. As a result, the sample holder enables differential scanning calorimetry Fourier-Transform Infrared Spectroscopy (DSC-FTIR) that can be performed in minutes rather than hours, as required in the prior art.

公开(公告)号：US11422084B2

公开(公告)日：2022-08-23

申请号：US16212499

申请日：2018-12-06

Applicant: California Institute of Technology

Inventor： Axel Scherer ,  Amirhossein Nateghi ,  Taeyoon Jeon

IPC: G01N21/03 ,  G01N1/42 ,  G01N1/44 ,  G01N21/17 ,  G01N21/25 ,  G01N21/35 ,  G01N21/3504 ,  G01N21/3577

Abstract: The present disclosure is directed toward a measurement system capable of rapid spectroscopic and calorimetric analysis of the chemical makeup of a test sample. Systems in accordance with the present disclosure include a low-thermal-mass sample holder having a substrate whose surface has been engineered to create a large-area sample-collection surface. The sample holder includes an integrated temperature controller that can rapidly heat or cool the test sample. As a result, the sample holder enables differential scanning calorimetry Fourier-Transform Infrared Spectroscopy (DSC-FTIR) that can be performed in minutes rather than hours, as required in the prior art.

公开(公告)号：US20190170637A1

公开(公告)日：2019-06-06

申请号：US16212499

申请日：2018-12-06

Applicant: California Institute of Technology

Inventor： Axel Scherer ,  Amirhossein Nateghi ,  Taeyoon Jeon

IPC: G01N21/25 ,  G01N21/35 ,  G01N1/44 ,  G01N1/42 ,  G01N21/17

Abstract: The present disclosure is directed toward a measurement system capable of rapid spectroscopic and calorimetric analysis of the chemical makeup of a test sample. Systems in accordance with the present disclosure include a low-thermal-mass sample holder having a substrate whose surface has been engineered to create a large-area sample-collection surface. The sample holder includes an integrated temperature controller that can rapidly heat or cool the test sample. As a result, the sample holder enables differential scanning calorimetry Fourier-Transform Infrared Spectroscopy (DSC-FTIR) that can be performed in minutes rather than hours, as required in the prior art.

公开(公告)号：US11619577B2

公开(公告)日：2023-04-04

申请号：US17864246

申请日：2022-07-13

Applicant: California Institute of Technology

Inventor： Axel Scherer ,  Amirhossein Nateghi ,  Taeyoon Jeon

IPC: G01N21/03 ,  G01N1/42 ,  G01N1/44 ,  G01N21/17 ,  G01N21/25 ,  G01N21/35 ,  G01N21/3504 ,  G01N21/3577

Abstract: The present disclosure is directed toward a measurement system capable of rapid spectroscopic and calorimetric analysis of the chemical makeup of a test sample. Systems in accordance with the present disclosure include a low-thermal-mass sample holder having a substrate whose surface has been engineered to create a large-area sample-collection surface. The sample holder includes an integrated temperature controller that can rapidly heat or cool the test sample. As a result, the sample holder enables differential scanning calorimetry Fourier-Transform Infrared Spectroscopy (DSC-FTIR) that can be performed in minutes rather than hours, as required in the prior art.

公开(公告)号：US11442002B2

公开(公告)日：2022-09-13

申请号：US16901352

申请日：2020-06-15

Applicant: California Institute of Technology

Inventor： Axel Scherer ,  Amirhossein Nateghi ,  Taeyoon Jeon ,  Frank T. Hartley

IPC: G01N21/03 ,  G01N1/42 ,  G01N1/44 ,  G01N21/17 ,  G01N21/25 ,  G01N21/35 ,  G01N21/3504 ,  G01N21/3577

Abstract: The present disclosure is directed toward optical elements, such as sample cuvettes, lenses, prisms, and the like, whose transmissivity is increased by the addition of a geometric anti-reflection layer disposed on at least one surface of the optical element, where the geometric anti-reflection layer includes a plurality of geometric features that collectively reduce the reflectivity of the interface between the surface and another medium. As a result, more of an optical signal incident on the surface passes through the interface. In some embodiments, every surface through which an optical signal passes includes a geometric anti-reflection layer. Due to the increased transmissivity of the optical element, in some embodiments, the use of low-cost, high-refractive-index materials, such as conventional silicon, is enabled.

公开(公告)号：US20230152211A1

公开(公告)日：2023-05-18

申请号：US17984177

申请日：2022-11-09

Applicant: California Institute of Technology

Inventor： Jack Jewell ,  Axel Scherer, Ph.D. ,  Amirhossein Nateghi ,  Taeyoon Jeon

IPC: G01N21/03 ,  G01N1/44 ,  G01N21/25 ,  G01N21/35

CPC classification number: G01N21/0303 ,  G01N1/44 ,  G01N21/35 ,  G01N21/255

Abstract: The present disclosure is directed toward measurement systems capable of optical analysis of a test sample. Embodiments in accordance with the present disclosure include a sample holder having a plurality of projections that extend from a planar surface, where the projections and planar surface collectively define an open sample-collection surface that enables an interrogation signal direct access to the test sample. The projections can be dimensioned and arranged to collectively define a geometric anti-reflection surface that is substantially non-reflective for the interrogation signal even at large angles of incidence. In some embodiments, the sample holder is configured as a reflective element that enables multiple passes of the interrogation signal through the test sample. In some embodiments, the sample holder is configured as a transmissive element. In some embodiments, the projections themselves are reflective.

公开(公告)号：US20200309676A1

公开(公告)日：2020-10-01

申请号：US16901352

申请日：2020-06-15

Applicant: California Institute of Technology

Inventor： Axel Scherer ,  Amirhossein Nateghi ,  Taeyoon Jeon ,  Frank T. Hartley

IPC: G01N21/03 ,  G01N1/42 ,  G01N1/44 ,  G01N21/17 ,  G01N21/25 ,  G01N21/35

Abstract: The present disclosure is directed toward optical elements, such as sample cuvettes, lenses, prisms, and the like, whose transmissivity is increased by the addition of a geometric anti-reflection layer disposed on at least one surface of the optical element, where the geometric anti-reflection layer includes a plurality of geometric features that collectively reduce the reflectivity of the interface between the surface and another medium. As a result, more of an optical signal incident on the surface passes through the interface. In some embodiments, every surface through which an optical signal passes includes a geometric anti-reflection layer. Due to the increased transmissivity of the optical element, in some embodiments, the use of low-cost, high-refractive-index materials, such as conventional silicon, is enabled.

公开(公告)号：US10712258B2

公开(公告)日：2020-07-14

申请号：US16212347

申请日：2018-12-06

Applicant: California Institute of Technology

Inventor： Axel Scherer ,  Amirhossein Nateghi ,  Taeyoon Jeon ,  Frank T. Hartley

IPC: G01N1/42 ,  G01N21/03 ,  G01N1/44 ,  G01N21/17 ,  G01N21/25 ,  G01N21/35 ,  G01N21/3504 ,  G01N21/3577

Abstract: The present disclosure is directed toward a cuvette for holding a test sample during optical interrogation with a light signal. The transmissivity of the cuvette is increased by a geometric anti-reflection layer disposed on at least one surface of the cuvette, where the geometric anti-reflection layer includes a plurality of geometric features that collectively reduce the reflectivity of the interface between the surface and another medium. As a result, more of the interrogation signal passes through the interface. In some embodiments, every surface through which the interrogation signal passes includes a geometric anti-reflection layer. Due to the increased transmissivity of the cuvette, light detected after passing through it can have an improved signal-to-noise ratio and/or the light signal used to interrogate the sample can have lower intensity. In addition, the reduction of the reflectivity of each surface enables the use of low-cost, high-refractive-index materials, such as conventional silicon.

公开(公告)号：US20190170633A1

公开(公告)日：2019-06-06

申请号：US16212347

申请日：2018-12-06

Applicant: California Institute of Technology

Inventor： Axel Scherer ,  Amirhossein Nateghi ,  Taeyoon Jeon ,  Frank T. Hartley

IPC: G01N21/03

CPC classification number: G01N21/0303 ,  G01N1/42 ,  G01N1/44 ,  G01N21/171 ,  G01N21/255 ,  G01N21/35 ,  G01N21/3504 ,  G01N21/3577

Abstract: The present disclosure is directed toward a cuvette for holding a test sample during optical interrogation with a light signal. The transmissivity of the cuvette is increased by a geometric anti-reflection layer disposed on at least one surface of the cuvette, where the geometric anti-reflection layer includes a plurality of geometric features that collectively reduce the reflectivity of the interface between the surface and another medium. As a result, more of the interrogation signal passes through the interface. In some embodiments, every surface through which the interrogation signal passes includes a geometric anti-reflection layer. Due to the increased transmissivity of the cuvette, light detected after passing through it can have an improved signal-to-noise ratio and/or the light signal used to interrogate the sample can have lower intensity. In addition, the reduction of the reflectivity of each surface enables the use of low-cost, high-refractive-index materials, such as conventional silicon.