Abstract:
The grating of an asymmetric, double pass, grating monochromator has an axis of rotation which extends at an angle Psi relative to a normal to a plane H H''. That plane is normal to, and bisects, a line extending between the monochromator entrance and exit slits. The angle Psi is characterized in that spectral overlap is substantially elmininated.
Abstract:
For use in a spectropolarimeter having an electromagnetic radiation beam source, a detector, a linear polarizer in the path of the beam between said source and detector, and first converter means in said path and characterized as operable to convert linearly polarized radiation to elliptically polarized radiation, the combination comprising: A. SECOND CONVERTER MEANS IN SAID PATH AND CHARACTERIZED AS OPERABLE TO CONVERT ELLIPTICALLY POLARIZED RADIATION TO LINEARLY POLARIZED RADIATION, AND B. A SAMPLE SPACE IN THE PATH OF THE BEAM PASSING FROM SAID SECOND CONVERTER MEANS.