公开(公告)号：US20150364433A1

公开(公告)日：2015-12-17

申请号：US14715208

申请日：2015-05-18

Applicant: Broadcom Corporation

Inventor： Nathan HINDMAN ,  Mark BUER

IPC: H01L23/00 ,  H03K19/20 ,  H03K3/356 ,  H01L29/08 ,  H01L27/092

CPC classification number: H01L23/576 ,  G06F21/554 ,  G06F21/70 ,  G06F21/72 ,  G06F21/86 ,  H01L27/092 ,  H01L29/0847 ,  H01L2924/0002 ,  H03K3/356 ,  H03K19/20 ,  H01L2924/00

Abstract: The present disclosure outlines various systems and methods for detecting an optical fault injection within an electronic device and/or preventing the optical fault injection from introducing an exploitable abnormality within the electronic device. These various systems and methods can include systems and methods that can detect or prevent laser injection attacks, which can include one or more small footprint complementary metal oxide silicon (CMOS) light detection circuits, or structures that can shield one or more transistors from a bottom side laser injection attack.

Abstract translation: 本公开概述了用于检测电子设备内的光学故障注入和/或防止光学故障注入在电子设备内引入可利用的异常的各种系统和方法。 这些各种系统和方法可以包括可以检测或防止激光注入攻击的系统和方法，其可以包括一个或多个小尺寸互补的金属氧化物硅（CMOS）光检测电路或可以从底部屏蔽一个或多个晶体管的结构 侧面激光注射攻击。