Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socket
    1.
    发明授权
    Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socket 失效
    用于在不可接近的引线阵列内的任意位置探测的方法和装置,焊球或引脚实际上将VLSI IC封装连接到衬底或插座

    公开(公告)号:US07372284B2

    公开(公告)日:2008-05-13

    申请号:US11345007

    申请日:2006-01-31

    IPC分类号: G01R1/067

    CPC分类号: G01R1/067 G01R1/04 G01R1/073

    摘要: A probe for an array of interconnecting leads between a PCA and an IC has one or more contacts extending laterally from or plated upon one or more arms formed of a flexible printed circuit, and connected by traces along the arm(s) to a header that itself affords connection to measurement equipment. The flexible printed circuit is thin enough to loosely slide between the top of the PCA or PCB and the bottom of the IC. The arm or arms is/are narrow enough to slide between the adjacent leads forming the array, while the normally flat contacts will successively interfere with, to engage and electrically contact, consecutive layers of leads as the probe is progressively inserted. An arm is not so stiff that it cannot yield by a slight compressive warping as the contacts encounter leads. Indexing may be ‘by feel’ or by visible indicia along a top surface of the probe or by a reticle device that moves over the top of the IC, which then has a pattern of indicia corresponding to lead location. Forming the shape of a Kapton substrate may also include use of a CVL operating in the range of 250 nm to 290 nm for the creation of extended copper contacts by the removal of underlying Kapton. Plating processes may also be used in the fabrication of (non-extended) wrap-around contacts at the edges of the Kapton.

    摘要翻译: 用于PCA和IC之间的互连引线阵列的探针具有从柔性印刷电路形成的一个或多个臂横向延伸或镀覆在一起的一个或多个触点,并且通过沿着臂的迹线连接到头部, 本身提供与测量设备的连接。 柔性印刷电路足够薄,以便在PCA或PCB的顶部和IC的底部之间松动地滑动。 臂或臂足够窄以在形成阵列的相邻引线之间滑动,而当探针逐渐插入时,通常平坦的触点将连续地干扰,接合和电接触连续的引线层。 手臂不那么僵硬,以至于由于接触碰撞而导致轻微的压缩翘曲不能屈服。 索引可以是“通过感觉”或通过沿着探针的顶表面的可见标记或通过在IC的顶部上移动的掩模版设备,其然后具有对应于引线位置的标记图案。 形成Kapton衬底的形状还可以包括使用在250nm至290nm范围内工作的CVL,以通过去除下面的Kapton来产生扩展的铜触点。 电镀工艺也可用于制造Kapton边缘的(非延伸)环绕触点。

    Probe accessories, and methods for probing test points using same
    2.
    发明授权
    Probe accessories, and methods for probing test points using same 失效
    探头附件以及使用相同方法探测测试点

    公开(公告)号:US07492173B2

    公开(公告)日:2009-02-17

    申请号:US11331664

    申请日:2006-01-12

    IPC分类号: G01R31/02

    CPC分类号: G01R31/2808

    摘要: Probe accessories, and methods for routing signals between a target and a test instrument using the probe accessories, are disclosed. Some of the probe accessories include a flexible circuit and first and second pairs of contacts. Flexible circuit design varies, but one embodiment has first and second regions, a first conductor and a second conductor, and a separation feature. The first conductor extends into the first region while the second conductor extends into both the first and second regions and has a fixed spacing with respect to the first conductor. A separation feature extends between first and second regions and is operable to create two independently maneuverable legs, each leg comprising an end portion of the first and second regions, while maintaining a fixed spacing between the first and second conductors. The first and second pairs of contacts electrically couple the probe accessories between test points and test instruments.

    摘要翻译: 公开了探头附件以及使用探头附件在目标和测试仪器之间路由信号的方法。 一些探头附件包括柔性电路和第一和第二对触点。 柔性电路设计不同,但是一个实施例具有第一和第二区域,第一导体和第二导体以及分离特征。 第一导体延伸到第一区域,而第二导体延伸到第一和第二区域中,并且相对于第一导体具有固定的间隔。 分离特征在第一和第二区域之间延伸并且可操作以产生两个独立可操纵的腿,每个腿包括第一和第二区域的端部部分,同时保持第一和第二导体之间的固定间隔。 第一和第二对触点在测试点和测试仪器之间电耦合探头附件。

    Regenerator probe
    3.
    发明授权
    Regenerator probe 失效
    再生器探头

    公开(公告)号:US07282935B2

    公开(公告)日:2007-10-16

    申请号:US11338274

    申请日:2006-01-24

    IPC分类号: G01R31/02 G01R31/28

    摘要: A probe apparatus has first and second access ports and a measurement port. The first and second access ports are adapted to be interposed in a test circuit. A voltage amplifier and a voltage splitter are adapted to present the second access port and the measurement port each with a voltage representative of a voltage received by the first access port.

    摘要翻译: 探针装置具有第一和第二入口和测量口。 第一和第二存取端口适于插入测试电路中。 电压放大器和分压器适于使第二存取端口和测量端口各自具有表示由第一接入端口接收的电压的电压。

    Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts
    4.
    发明授权
    Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts 失效
    探头组件带有受控制的阻抗弹簧销或电阻头弹簧销触点

    公开(公告)号:US07116121B1

    公开(公告)日:2006-10-03

    申请号:US11261178

    申请日:2005-10-27

    IPC分类号: G01R31/02

    摘要: Uncontrolled characteristic impedance along a spring biased pin probe assembly is avoided by providing a stepped shelf of ground plane that extends outward along the pin and toward the target signal. The length of outward extension is chosen such that even when there is only (or at least) an expected minimum amount of compression of the spring while producing and maintaining contact, the entire exposed portion of the pin is over the shelf, whose depth of step has been selected to produce a selected Z0 for the exposed pin that matches Z0 for existing transmission lines already within the probe assembly. The spring biased pin may be a resistor tip spring pin that includes a small resistor in its tip.

    摘要翻译: 通过提供沿着引脚向外延伸并朝向目标信号的接地平面的阶梯架来避免沿着弹簧偏置的针探针组件的不受控制的特性阻抗。 选择向外延伸的长度,使得即使仅产生(或至少)弹簧的期望的最小压缩量而产生和保持接触,销的整个暴露部分在架子的上方,其深度为步长 已经被选择为针对已经在探针组件内的现有传输线匹配Z <0> 的裸露引脚产生选定的Z <0> 。 弹簧偏置引脚可以是电阻器尖端弹簧销,其在其尖端中包括小电阻器。

    Probes with perpendicularly disposed spring pins, and methods of making and using same
    6.
    发明授权
    Probes with perpendicularly disposed spring pins, and methods of making and using same 失效
    具有垂直设置的弹簧销的探头,以及制造和使用它们的方法

    公开(公告)号:US07046020B2

    公开(公告)日:2006-05-16

    申请号:US10781086

    申请日:2004-02-17

    IPC分类号: G01R31/02

    摘要: A probe for probing test points on a target board uses a printed circuit board (PCB) having a plurality of signal routes for routing signals to a test instrument. The probe also has a plurality of spring pins for probing the test points on the target board. Each of the spring pins is i) disposed perpendicularly to the PCB, and ii) electrically coupled to at least one signal route of the PCB. By way of example, the spring pins may be fit into holes in the PCB or, alternately, they may be electrically coupled to signal routes of a second PCB that is perpendicularly abutted to the first PCB. Methods for making and using such probes are also disclosed.

    摘要翻译: 用于在目标板上探测测试点的探针使用具有多个信号路由的印刷电路板(PCB)来将信号路由到测试仪器。 探头还具有多个用于探测目标板上的测试点的弹簧销。 每个弹簧销i)垂直于PCB布置,并且ii)电连接到PCB的至少一个信号路径。 作为示例,弹簧销可以装配在PCB中的孔中,或者可以将它们电耦合到垂直邻接第一PCB的第二PCB的信号路径。 还公开了制造和使用这种探针的方法。

    Alignment/retention device for connector-less probe
    7.
    发明授权
    Alignment/retention device for connector-less probe 失效
    无连接器探头对准/保持装置

    公开(公告)号:US06822466B1

    公开(公告)日:2004-11-23

    申请号:US10644365

    申请日:2003-08-20

    IPC分类号: G01R104

    CPC分类号: G01R1/0416

    摘要: An alignment/retention device. The device includes a housing having a first side and an opposing second side. The housing includes an opening which extends from the first side to the second side. Multiple alignment pins are imbedded in the housing and extend external to both the first and second sides. On the first side the alignment pins are capable of insertion into matching holes on an electronic probe, and on the second side the alignment pins are capable of insertion into matching holes on an electronic circuit assembly.

    摘要翻译: 对准/保持装置。 该装置包括具有第一侧和相对的第二侧的壳体。 壳体包括从第一侧延伸到第二侧的开口。 多个对准销被插入壳体中并且在第一侧和第二侧外部延伸。 在第一侧,对准销能够插入到电子探针上的匹配孔中,而在第二侧上,对准销能够插入到电子电路组件上的匹配孔中。

    Integrated ball grid array-pin grid array-flex laminate test assembly
    8.
    发明授权
    Integrated ball grid array-pin grid array-flex laminate test assembly 失效
    集成球栅阵列针阵列 - 柔性层压板测试组件

    公开(公告)号:US06638080B2

    公开(公告)日:2003-10-28

    申请号:US09764551

    申请日:2001-01-18

    IPC分类号: G01R3102

    摘要: An integrated probe assembly provides the capability to test integrated circuit (IC) packages mounted onto ball grid arrays. The present invention comprises an unsealed BGA socket (102), nail head pins (107) which can be inserted flush into a pin carrier to produce a PGA header (103), a Flex circuit assembly comprising a piece of flexible circuit (104) with various passive resistors and connectors attached and solder preforms (113) used to solder the flex assembly to the pin grid array. Matched impedance connectors (105) are attached at an end of the flexible circuit.

    摘要翻译: 集成探头组件提供测试安装在球栅阵列上的集成电路(IC)封装的能力。 本发明包括一个未密封的BGA插座(102),钉头销(107),可以插入针脚托架中以形成PGA插头(103),Flex电路组件包括一片柔性电路(104) 各种被动电阻器和连接器和用于将柔性组件焊接到针栅阵列的焊料预成型件(113)。 匹配阻抗连接器(105)附接在柔性电路的一端。

    Probe for testing circuits, and associated methods
    9.
    发明授权
    Probe for testing circuits, and associated methods 失效
    测试电路的探头和相关方法

    公开(公告)号:US06867609B2

    公开(公告)日:2005-03-15

    申请号:US10373820

    申请日:2003-02-25

    摘要: A connector-less probe is disclosed. The probe permits probing of a board or bus without the use of a mating connector. The probe has a support attached to the probing end of the probe. A spring pin and an isolation network are attached to the support. The support is arranged substantially perpendicular to a target board during probing of a test point on the target board. The spring pin engages the test point on the target board. The spring pin is arranged substantially perpendicular to the target board when the spring pin engages the test point on the target board, and the spring pin is securely attached to the support so that the spring pin is substantially parallel to the support. The isolation network is electrically coupled to the spring pin so that the spring pin is located between the isolation network and the test point during probing of the test point. The isolation network is also securely attached to the support.

    摘要翻译: 公开了一种无连接器探头。 该探头允许在不使用配合连接器的情况下探测板或总线。 探针具有附接到探头探测端的支撑。 弹簧销和隔离网络连接到支架上。 在探测目标板上的测试点时,支撑件基本上垂直于目标板布置。 弹簧销接合目标板上的测试点。 当弹簧销接合目标板上的测试点时,弹簧销基本上垂直于目标板布置,并且弹簧销牢固地附接到支撑件,使得弹簧销基本上平行于支撑件。 隔离网络电耦合到弹簧销,使得在探测测试点期间弹簧销位于隔离网络和测试点之间。 隔离网络也牢固地连接到支架上。