公开(公告)号：US07372284B2

公开(公告)日：2008-05-13

申请号：US11345007

申请日：2006-01-31

申请人： Brent A. Holcombe ,  Brock J. LaMeres ,  Kenneth W Johnson

发明人： Brent A. Holcombe ,  Brock J. LaMeres ,  Kenneth W Johnson

IPC分类号： G01R1/067

CPC分类号： G01R1/067 ,  G01R1/04 ,  G01R1/073

摘要： A probe for an array of interconnecting leads between a PCA and an IC has one or more contacts extending laterally from or plated upon one or more arms formed of a flexible printed circuit, and connected by traces along the arm(s) to a header that itself affords connection to measurement equipment. The flexible printed circuit is thin enough to loosely slide between the top of the PCA or PCB and the bottom of the IC. The arm or arms is/are narrow enough to slide between the adjacent leads forming the array, while the normally flat contacts will successively interfere with, to engage and electrically contact, consecutive layers of leads as the probe is progressively inserted. An arm is not so stiff that it cannot yield by a slight compressive warping as the contacts encounter leads. Indexing may be ‘by feel’ or by visible indicia along a top surface of the probe or by a reticle device that moves over the top of the IC, which then has a pattern of indicia corresponding to lead location. Forming the shape of a Kapton substrate may also include use of a CVL operating in the range of 250 nm to 290 nm for the creation of extended copper contacts by the removal of underlying Kapton. Plating processes may also be used in the fabrication of (non-extended) wrap-around contacts at the edges of the Kapton.

摘要翻译： 用于PCA和IC之间的互连引线阵列的探针具有从柔性印刷电路形成的一个或多个臂横向延伸或镀覆在一起的一个或多个触点，并且通过沿着臂的迹线连接到头部， 本身提供与测量设备的连接。 柔性印刷电路足够薄，以便在PCA或PCB的顶部和IC的底部之间松动地滑动。 臂或臂足够窄以在形成阵列的相邻引线之间滑动，而当探针逐渐插入时，通常平坦的触点将连续地干扰，接合和电接触连续的引线层。 手臂不那么僵硬，以至于由于接触碰撞而导致轻微的压缩翘曲不能屈服。 索引可以是“通过感觉”或通过沿着探针的顶表面的可见标记或通过在IC的顶部上移动的掩模版设备，其然后具有对应于引线位置的标记图案。 形成Kapton衬底的形状还可以包括使用在250nm至290nm范围内工作的CVL，以通过去除下面的Kapton来产生扩展的铜触点。 电镀工艺也可用于制造Kapton边缘的（非延伸）环绕触点。

公开(公告)号：US07492173B2

公开(公告)日：2009-02-17

申请号：US11331664

申请日：2006-01-12

申请人： Brock J. LaMeres ,  Brent A. Holcombe ,  Kenneth Johnson

发明人： Brock J. LaMeres ,  Brent A. Holcombe ,  Kenneth Johnson

IPC分类号： G01R31/02

CPC分类号： G01R31/2808

摘要： Probe accessories, and methods for routing signals between a target and a test instrument using the probe accessories, are disclosed. Some of the probe accessories include a flexible circuit and first and second pairs of contacts. Flexible circuit design varies, but one embodiment has first and second regions, a first conductor and a second conductor, and a separation feature. The first conductor extends into the first region while the second conductor extends into both the first and second regions and has a fixed spacing with respect to the first conductor. A separation feature extends between first and second regions and is operable to create two independently maneuverable legs, each leg comprising an end portion of the first and second regions, while maintaining a fixed spacing between the first and second conductors. The first and second pairs of contacts electrically couple the probe accessories between test points and test instruments.

摘要翻译： 公开了探头附件以及使用探头附件在目标和测试仪器之间路由信号的方法。 一些探头附件包括柔性电路和第一和第二对触点。 柔性电路设计不同，但是一个实施例具有第一和第二区域，第一导体和第二导体以及分离特征。 第一导体延伸到第一区域，而第二导体延伸到第一和第二区域中，并且相对于第一导体具有固定的间隔。 分离特征在第一和第二区域之间延伸并且可操作以产生两个独立可操纵的腿，每个腿包括第一和第二区域的端部部分，同时保持第一和第二导体之间的固定间隔。 第一和第二对触点在测试点和测试仪器之间电耦合探头附件。

公开(公告)号：US07116121B1

公开(公告)日：2006-10-03

申请号：US11261178

申请日：2005-10-27

申请人： Brent A. Holcombe ,  Brock J. LaMeres ,  Donald M. Logelin

发明人： Brent A. Holcombe ,  Brock J. LaMeres ,  Donald M. Logelin

IPC分类号： G01R31/02

CPC分类号： G01R1/06772 ,  G01R1/06722 ,  G01R1/07314 ,  H01R13/2421

摘要： Uncontrolled characteristic impedance along a spring biased pin probe assembly is avoided by providing a stepped shelf of ground plane that extends outward along the pin and toward the target signal. The length of outward extension is chosen such that even when there is only (or at least) an expected minimum amount of compression of the spring while producing and maintaining contact, the entire exposed portion of the pin is over the shelf, whose depth of step has been selected to produce a selected Z0 for the exposed pin that matches Z0 for existing transmission lines already within the probe assembly. The spring biased pin may be a resistor tip spring pin that includes a small resistor in its tip.

摘要翻译： 通过提供沿着引脚向外延伸并朝向目标信号的接地平面的阶梯架来避免沿着弹簧偏置的针探针组件的不受控制的特性阻抗。 选择向外延伸的长度，使得即使仅产生（或至少）弹簧的期望的最小压缩量而产生和保持接触，销的整个暴露部分在架子的上方，其深度为步长 已经被选择为针对已经在探针组件内的现有传输线匹配Z <0> 的裸露引脚产生选定的Z <0> 。 弹簧偏置引脚可以是电阻器尖端弹簧销，其在其尖端中包括小电阻器。

公开(公告)号：US07282935B2

公开(公告)日：2007-10-16

申请号：US11338274

申请日：2006-01-24

申请人： Glenn Wood ,  Donald M. Logelin ,  Brock J. LaMeres ,  Brent A. Holcombe

发明人： Glenn Wood ,  Donald M. Logelin ,  Brock J. LaMeres ,  Brent A. Holcombe

IPC分类号： G01R31/02 ,  G01R31/28

CPC分类号： G01R31/31905 ,  G01R1/06772 ,  G01R1/24

摘要： A probe apparatus has first and second access ports and a measurement port. The first and second access ports are adapted to be interposed in a test circuit. A voltage amplifier and a voltage splitter are adapted to present the second access port and the measurement port each with a voltage representative of a voltage received by the first access port.

摘要翻译： 探针装置具有第一和第二入口和测量口。 第一和第二存取端口适于插入测试电路中。 电压放大器和分压器适于使第二存取端口和测量端口各自具有表示由第一接入端口接收的电压的电压。

公开(公告)号：US07242202B2

公开(公告)日：2007-07-10

申请号：US11141500

申请日：2005-05-31

申请人： Joseph Groshong ,  Brock J. LaMeres ,  Brent A. Holcombe

发明人： Joseph Groshong ,  Brock J. LaMeres ,  Brent A. Holcombe

IPC分类号： G01R1/073

CPC分类号： G01R1/06772 ,  G01R1/06766

摘要： A probe includes an electrical element. The probe has reduced parasitic loading. A probe assembly with a plurality of probes is also disclosed.

摘要翻译： 探头包括电气元件。 探头减少了寄生负载。 还公开了具有多个探针的探针组件。

公开(公告)号：US07046020B2

公开(公告)日：2006-05-16

申请号：US10781086

申请日：2004-02-17

申请人： Brock J. LaMeres ,  Brent A. Holcombe ,  Kenneth Johnson

发明人： Brock J. LaMeres ,  Brent A. Holcombe ,  Kenneth Johnson

IPC分类号： G01R31/02

CPC分类号： G01R1/07357 ,  G01R1/07314 ,  G01R1/07328

摘要： A probe for probing test points on a target board uses a printed circuit board (PCB) having a plurality of signal routes for routing signals to a test instrument. The probe also has a plurality of spring pins for probing the test points on the target board. Each of the spring pins is i) disposed perpendicularly to the PCB, and ii) electrically coupled to at least one signal route of the PCB. By way of example, the spring pins may be fit into holes in the PCB or, alternately, they may be electrically coupled to signal routes of a second PCB that is perpendicularly abutted to the first PCB. Methods for making and using such probes are also disclosed.

摘要翻译： 用于在目标板上探测测试点的探针使用具有多个信号路由的印刷电路板（PCB）来将信号路由到测试仪器。 探头还具有多个用于探测目标板上的测试点的弹簧销。 每个弹簧销i）垂直于PCB布置，并且ii）电连接到PCB的至少一个信号路径。 作为示例，弹簧销可以装配在PCB中的孔中，或者可以将它们电耦合到垂直邻接第一PCB的第二PCB的信号路径。 还公开了制造和使用这种探针的方法。

公开(公告)号：US06822466B1

公开(公告)日：2004-11-23

申请号：US10644365

申请日：2003-08-20

申请人： Brent A. Holcombe ,  Brock J. LaMeres

发明人： Brent A. Holcombe ,  Brock J. LaMeres

IPC分类号： G01R104

CPC分类号： G01R1/0416

摘要： An alignment/retention device. The device includes a housing having a first side and an opposing second side. The housing includes an opening which extends from the first side to the second side. Multiple alignment pins are imbedded in the housing and extend external to both the first and second sides. On the first side the alignment pins are capable of insertion into matching holes on an electronic probe, and on the second side the alignment pins are capable of insertion into matching holes on an electronic circuit assembly.

摘要翻译： 对准/保持装置。 该装置包括具有第一侧和相对的第二侧的壳体。 壳体包括从第一侧延伸到第二侧的开口。 多个对准销被插入壳体中并且在第一侧和第二侧外部延伸。 在第一侧，对准销能够插入到电子探针上的匹配孔中，而在第二侧上，对准销能够插入到电子电路组件上的匹配孔中。

公开(公告)号：US07338292B2

公开(公告)日：2008-03-04

申请号：US11340067

申请日：2006-01-26

申请人： Kenneth W Johnson ,  Brock J. LaMeres

发明人： Kenneth W Johnson ,  Brock J. LaMeres

IPC分类号： H01R12/00 ,  H05K1/00

CPC分类号： H01R12/721 ,  H01R12/59 ,  H05K3/301 ,  H05K3/325 ,  H05K3/3452 ,  H05K3/3457 ,  H05K3/365 ,  H05K3/366 ,  H05K2203/167

摘要： A board-to-board interconnect is presented. The interconnect is fashioned from solder beads or hemi-ellipsoidal surface features on a surface of a printed circuit board and contact pads on a second printed circuit board.

摘要翻译： 提出了一种板对板互连。 互连由印刷电路板的表面上的焊料珠或半椭球表面特征和第二印刷电路板上的接触焊盘形成。

公开(公告)号：US07025628B2

公开(公告)日：2006-04-11

申请号：US10640069

申请日：2003-08-13

申请人： Brock J. LaMeres ,  Kenneth W. Johnson

发明人： Brock J. LaMeres ,  Kenneth W. Johnson

IPC分类号： H01R11/00

CPC分类号： H01R31/06 ,  G01R1/06788 ,  H01R11/18 ,  H01R2201/20

摘要： An electronic probe extender. In representative embodiments, an electronic probe extender is disclosed which includes a probe connector that is capable of electronic contact to an electronic test probe, an electronic signal conductor connected electronically to the probe connector, and an electronic probe tip connected electronically to the signal conductor. The electronic probe tip includes a tapered electronically conductive tip. The electronic probe tip is capable of electronic connection to an electronic test point.

摘要翻译： 电子探针扩展器。 在代表性的实施例中，公开了一种电子探针扩展器，其包括能够电子接触电子测试探针的探针连接器，电连接到探针连接器的电子信号导体以及电子地连接到信号导体的电子探针尖端。 电子探针尖端包括锥形的电子导电尖端。 电子探针头能够电子连接到电子测试点。

公开(公告)号：US07323892B1

公开(公告)日：2008-01-29

申请号：US11448700

申请日：2006-06-07

申请人： Brock J. LaMeres ,  Brent Holcombe

发明人： Brock J. LaMeres ,  Brent Holcombe

IPC分类号： G01R31/02

CPC分类号： G01R1/07328 ,  G01R31/2808

摘要： In one embodiment, a probe for probing test points on a target board includes a printed circuit board, a frame, and a plurality of spring pins. The printed circuit board (PCB) has a first side with a plurality of solder pads thereon, and a plurality of signal routes that are electrically coupled to the solder pads for routing signals to a test instrument. The frame is mechanically coupled to the PCB and has a main body portion with a plurality of holes therein. The holes in the frame are aligned with the plurality of solder pads on the first side of the PCB. The plurality of spring pins are provided for probing the test points on the target board, with each spring pin being i) disposed in one of the holes in the frame, perpendicularly abutting the first side of the PCB, and ii) electrically coupled to one of the solder pads. Other embodiments, including a method of making a probe, are also disclosed.

摘要翻译： 在一个实施例中，用于探测目标板上的测试点的探针包括印刷电路板，框架和多个弹簧销。 印刷电路板（PCB）具有在其上具有多个焊盘的第一侧和与焊料焊盘电耦合以将信号路由到测试仪器的多条信号路线。 框架机械地联接到PCB并且具有其中具有多个孔的主体部分。 框架中的孔与PCB的第一侧上的多个焊盘对齐。 多个弹簧销用于探测目标板上的测试点，每个弹簧销i设置在框架的一个孔中，垂直地邻接PCB的第一侧，并且ii）电耦合到一个 的焊盘。 还公开了包括制作探针的方法的其它实施例。