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公开(公告)号：US11555921B2
公开(公告)日：2023-01-17
申请号：US16721488
申请日：2019-12-19
Inventor： Huihui Xiao , Lei Nie , Jiangliang Guo , Xu Li
Abstract: Embodiments of the present disclosure provide a method and apparatus for predicting a severe convection weather. The method may include: acquiring a current radar echo map sequence, the current radar echo map sequence being a radar echo map sequence within a current time period; generating, based on the current radar echo map sequence, a future radar echo map sequence, the future radar echo map sequence being a radar echo map sequence within a future time period; and inputting the future radar echo map sequence into a pre-trained severe convection weather predicting model to obtain a severe convection weather intensity predicting map, where the severe convection weather predicting model is used to predict the intensity of a severe convection weather.
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公开(公告)号：US20220270228A1
公开(公告)日：2022-08-25
申请号：US17443013
申请日：2021-07-19
Inventor： Ye Su , Sike Ren , Lei Nie , Feng Huang
Abstract: A method and an apparatus for obtaining information are provided. The method may include: obtaining at least one image feature from a to-be-inspected image, where the to-be-inspected image includes an image of a to-be-inspected item, and the image feature is used to represent surface feature information of the to-be-inspected item; and importing the to-be-inspected image and the at least one image feature into a pre-trained defect detection model to obtain defect information corresponding to the to-be-inspected item, where the defect detection model is obtained by training using a sample image, a sample image feature and sample defect information, and configured to represent a corresponding relationship between the to-be-inspected image and the at least one image feature.
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公开(公告)号：US12154262B2
公开(公告)日：2024-11-26
申请号：US17444883
申请日：2021-08-11
Inventor： Huihui Xiao , Lei Nie , Jianfa Zou , Feng Huang
Abstract: Provided are an image defect detection method and apparatus, an electronic device, a storage medium and a product. The method includes acquiring a to-be-detected image; obtaining a restored image corresponding to the to-be-detected image based on the to-be-detected image, at least one mask image group and a plurality of defect-free positive sample images, where each mask image group includes at least two binary images having a complementary relationship, and different mask image groups have different image sizes; and locating a defect of the to-be-detected image based on the to-be-detected image and each restored image. The solution solves the problem in which a related defect detection method requires numerous manual operations and has a low detection accuracy due to subjective factors of a worker.
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公开(公告)号：US11615524B2
公开(公告)日：2023-03-28
申请号：US17248053
申请日：2021-01-07
Inventor： Ye Su , Lei Nie , Jianfa Zou , Feng Huang
Abstract: A product defect detection method and apparatus, an electronic device, and a storage medium are provided. A method includes: acquiring a multi-channel image of a target product; inputting the multi-channel image to a defect detection model, wherein the defect detection model includes a plurality of convolutional branches, a merging module and a convolutional headbranch; performing feature extraction on each channel in the multi-channel image by using the plurality of convolutional branches, to obtain a plurality of first characteristic information; merging the plurality of first characteristic information by using the merging module, to obtain second characteristic information; performing feature extraction on the second characteristic information by using the convolutional headbranch, to obtain third characteristic information to be output by the defect detection model; and determining defect information of the target product based on the third characteristic information.
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