公开(公告)号：US20220270228A1

公开(公告)日：2022-08-25

申请号：US17443013

申请日：2021-07-19

Applicant: Beijing Baidu Netcom Science and Technology Co., Ltd.

Inventor： Ye Su ,  Sike Ren ,  Lei Nie ,  Feng Huang

IPC: G06T7/00 ,  G06V10/54

Abstract: A method and an apparatus for obtaining information are provided. The method may include: obtaining at least one image feature from a to-be-inspected image, where the to-be-inspected image includes an image of a to-be-inspected item, and the image feature is used to represent surface feature information of the to-be-inspected item; and importing the to-be-inspected image and the at least one image feature into a pre-trained defect detection model to obtain defect information corresponding to the to-be-inspected item, where the defect detection model is obtained by training using a sample image, a sample image feature and sample defect information, and configured to represent a corresponding relationship between the to-be-inspected image and the at least one image feature.