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公开(公告)号：US20220270228A1
公开(公告)日：2022-08-25
申请号：US17443013
申请日：2021-07-19
Inventor： Ye Su , Sike Ren , Lei Nie , Feng Huang
Abstract: A method and an apparatus for obtaining information are provided. The method may include: obtaining at least one image feature from a to-be-inspected image, where the to-be-inspected image includes an image of a to-be-inspected item, and the image feature is used to represent surface feature information of the to-be-inspected item; and importing the to-be-inspected image and the at least one image feature into a pre-trained defect detection model to obtain defect information corresponding to the to-be-inspected item, where the defect detection model is obtained by training using a sample image, a sample image feature and sample defect information, and configured to represent a corresponding relationship between the to-be-inspected image and the at least one image feature.
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公开(公告)号：US11615524B2
公开(公告)日：2023-03-28
申请号：US17248053
申请日：2021-01-07
Inventor： Ye Su , Lei Nie , Jianfa Zou , Feng Huang
Abstract: A product defect detection method and apparatus, an electronic device, and a storage medium are provided. A method includes: acquiring a multi-channel image of a target product; inputting the multi-channel image to a defect detection model, wherein the defect detection model includes a plurality of convolutional branches, a merging module and a convolutional headbranch; performing feature extraction on each channel in the multi-channel image by using the plurality of convolutional branches, to obtain a plurality of first characteristic information; merging the plurality of first characteristic information by using the merging module, to obtain second characteristic information; performing feature extraction on the second characteristic information by using the convolutional headbranch, to obtain third characteristic information to be output by the defect detection model; and determining defect information of the target product based on the third characteristic information.
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公开(公告)号：US11341626B2
公开(公告)日：2022-05-24
申请号：US16665857
申请日：2019-10-28
Inventor： Yawei Wen , Jiabing Leng , Chengcheng Wang , Ye Su , Minghao Liu , Yulin Xu , Jiangliang Guo , Xu Li
Abstract: Embodiments of the present disclosure relate to a method and apparatus for outputting information. The method can include: acquiring an image of a to-be-inspected object; segmenting the image into at least one subimage; for a subimage in the at least one subimage, inputting the subimage into a pre-trained defect classification model to obtain a defect category corresponding to the subimage; and outputting defect information of the object based on a defect category corresponding to each subimage.
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