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公开(公告)号：US11635449B2
公开(公告)日：2023-04-25
申请号：US17722603
申请日：2022-04-18
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
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公开(公告)号：US20220252638A1
公开(公告)日：2022-08-11
申请号：US17722603
申请日：2022-04-18
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
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公开(公告)号：US11307220B2
公开(公告)日：2022-04-19
申请号：US17234185
申请日：2021-04-19
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
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公开(公告)号：US20200041541A1
公开(公告)日：2020-02-06
申请号：US16530725
申请日：2019-08-02
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
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公开(公告)号：US20240175895A1
公开(公告)日：2024-05-30
申请号：US18431503
申请日：2024-02-02
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
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公开(公告)号：US20210239732A1
公开(公告)日：2021-08-05
申请号：US17234185
申请日：2021-04-19
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
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公开(公告)号：US11940461B2
公开(公告)日：2024-03-26
申请号：US18133054
申请日：2023-04-11
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
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公开(公告)号：US20230243867A1
公开(公告)日：2023-08-03
申请号：US18133054
申请日：2023-04-11
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
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公开(公告)号：US11029330B2
公开(公告)日：2021-06-08
申请号：US16530725
申请日：2019-08-02
申请人： BRUKER NANO, INC.
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
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