Abstract:
A semiconductor device fabrication operation is commonly used to manufacture one or more integrated circuits onto a semiconductor substrate. The semiconductor device fabrication operation forms one or more transistors onto an arrangement of fabrication layers to form the one or more integrated circuits which introduces unwanted capacitances, often referred to as parasitic capacitances, into the one or more transistors. The one or more integrated circuits include one or more compensation modules that, when combined with the parasitic capacitances of the one or more transistors, ideally linearizes the non-linearity caused by the parasitic capacitances of the one or more transistors. For example, the one or more compensation modules incorporate a non-linear or a piecewise linear transfer function that is inversely related to the parasitic capacitances of the one or more transistors.
Abstract:
A voltage multiplier circuit. The voltage multiplier circuit includes a storage element, a first transistor, a second transistor and third transistor. The storage element has a first end and a second end. The second end is coupled to a clock signal input. The first transistor has a gate coupled to a voltage node, a first terminal coupled to a supply node, and a second terminal coupled to the first end of the storage element. A second transistor has a first terminal coupled to the first end of the storage element and a second terminal coupled to the voltage output. The third transistor has a gate in communication with the clock input and a first terminal coupled to the voltage node.
Abstract:
A multi-lane analog-to-digital converter (ADC) is disclosed that is capable of compensating for one or more of its impairments such that its digital output accurately represents its analog input. The multi-lane ADC can compensate for unwanted phase offsets between multiple phases of a sampling clock used by the multi-lane ADC, unwanted bandwidth mismatches between lanes in the multi-lane ADC, and/or unwanted gain mismatches between the lanes in the multi-lane ADC to provide some examples.
Abstract:
A multi-lane analog-to-digital converter (ADC) is disclosed that is capable of compensating for one or more of its impairments such that its digital output accurately represents its analog input. The multi-lane ADC can compensate for unwanted phase offsets between multiple phases of a sampling clock used by the multi-lane ADC, unwanted bandwidth mismatches between lanes in the multi-lane ADC, and/or unwanted gain mismatches between the lanes in the multi-lane ADC to provide some examples.
Abstract:
A voltage multiplier circuit. The voltage multiplier circuit includes a storage element, a first transistor, a second transistor and third transistor. The storage element has a first end and a second end. The second end is coupled to a clock signal input. The first transistor has a gate coupled to a voltage node, a first terminal coupled to a supply node, and a second terminal coupled to the first end of the storage element. A second transistor has a first terminal coupled to the first end of the storage element and a second terminal coupled to the voltage output. The third transistor has a gate in communication with the clock input and a first terminal coupled to the voltage node.