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公开(公告)号:US20220076981A1
公开(公告)日:2022-03-10
申请号:US17014474
申请日:2020-09-08
Applicant: Applied Materials, Inc.
Inventor: Lakshmikanth Krishnamurthy SHIRAHATTI , Kirankumar Neelasandra SAVANDAIAH , Thomas BREZOCZKY , Ganesh SUBBUSWAMY
IPC: H01L21/683 , H01L21/687 , H01L21/67
Abstract: A substrate support for a processing region comprises a compliant sealing device comprising. The compliant sealing device comprises a coupling mechanism, a sealing device body, and a bellows. The coupling mechanism comprises a mating surface configured to interface with an opposing surface of an electrostatic chuck. The mating surface is configured to form a separable seal when disposed against the opposing surface of the electrostatic chuck. The sealing device body is connected to the coupling mechanism and comprises a passageway. The bellows surrounds the sealing device body.
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2.
公开(公告)号:US20230323536A1
公开(公告)日:2023-10-12
申请号:US18333361
申请日:2023-06-12
Applicant: Applied Materials, Inc.
Inventor: Kirankumar Neelasandra SAVANDAIAH , Srinivasa Rao YEDLA , Nitin Bharadwaj SATYAVOLU , Ganesh SUBBUSWAMY , Devi Raghavee VEERAPPAN , Thomas BREZOCZKY
IPC: C23C16/455 , C23C14/22 , C23C14/34
CPC classification number: C23C16/45574 , C23C16/45544 , C23C14/34 , C23C14/228
Abstract: Aspects of the present disclosure provide systems and apparatuses for a substrate processing assembly with a laminar flow cavity gas injection for high and low pressure. A dual gas reservoir assembly is provided in a substrate processing chamber, positioned within a lower shield assembly. A first gas reservoir is in fluid communication with a processing volume of the substrate processing assembly via a plurality of gas inlet, positioned circumferentially about the processing volume. A second gas reservoir is positioned circumferentially about the first gas reservoir, coupled therewith via one or more reservoir ports. The second gas reservoir is in fluid communication with a first gas source. A recursive path gas assembly is positioned in an upper shield body adjacent to an electrode to provide one or more gases to a dark space gap.
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3.
公开(公告)号:US20220243331A1
公开(公告)日:2022-08-04
申请号:US17166762
申请日:2021-02-03
Applicant: Applied Materials, Inc.
Inventor: Kirankumar Neelasandra SAVANDAIAH , Srinivasa Rao YEDLA , Nitin Bharadwaj SATYAVOLU , Ganesh SUBBUSWAMY , Devi Raghavee VEERAPPAN , Thomas BREZOCZKY
IPC: C23C16/455 , C23C14/34 , C23C14/22
Abstract: Aspects of the present disclosure provide systems and apparatuses for a substrate processing assembly with a laminar flow cavity gas injection for high and low pressure. A dual gas reservoir assembly is provided in a substrate processing chamber, positioned within a lower shield assembly. A first gas reservoir is in fluid communication with a processing volume of the substrate processing assembly via a plurality of gas inlet, positioned circumferentially about the processing volume. A second gas reservoir is positioned circumferentially about the first gas reservoir, coupled therewith via one or more reservoir ports. The second gas reservoir is in fluid communication with a first gas source. A recursive path gas assembly is positioned in an upper shield body adjacent to an electrode to provide one or more gases to a dark space gap.
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