公开(公告)号：US20140316731A1

公开(公告)日：2014-10-23

申请号：US13868540

申请日：2013-04-23

Applicant: APPLE INC.

Inventor： Preminder Singh ,  Date Jan Willem Noorlag ,  Sung Wook Kang

IPC: H01L21/66

CPC classification number: H01L22/20 ,  H01L22/14

Abstract: A binning process uses curve fitting to create and assign one or more bins based on testing data of operating voltage versus leakage current for test integrated circuits. Each bin is created by assigning an initial operating voltage to the bin and fitting a curve to the testing data population. An equation is generated describing the fitted curve. Integrated circuits are binned by measuring the leakage current at a selected operating voltage and testing the integrated circuit at one or more operating voltages determined based on the fitted curves. The integrated circuits are assigned a maximum operating voltage that corresponds to the lowest tested operating voltage at which the integrated circuit passes the test.

Abstract translation: 合并过程使用曲线拟合来创建和分配一个或多个基于测试集成电路的工作电压与泄漏电流的测试数据。 每个仓是通过将初始工作电压分配给仓并将曲线拟合到测试数据群来创建的。 生成描述拟合曲线的方程式。 集成电路通过测量所选工作电压下的漏电流并在基于拟合曲线确定的一个或多个工作电压下测试集成电路进行分组。 分配集成电路的最大工作电压对应于集成电路通过测试的最低测试工作电压。

公开(公告)号：US20150212120A1

公开(公告)日：2015-07-30

申请号：US14168177

申请日：2014-01-30

Applicant: Apple Inc.

Inventor： Preminder Singh ,  Sung Wook Kang

IPC: G01R19/00 ,  G01R31/02

CPC classification number: G01R31/3004 ,  G01R31/2879 ,  G06F1/324 ,  H01L22/34

Abstract: A device includes an integrated circuit programmed with an operating surface equation. The operating surface equation may define an operating point as a function of operating voltage, operating frequency, and leakage current. The operating surface equation may be generated by fitting a surface equation to data for operating voltage and operating frequency versus leakage current for a plurality of test integrated circuits. An operating voltage of the integrated circuit at a given operating frequency may be determined by the operating surface equation and a leakage current value fused into the device.

Abstract translation: 一种器件包括用操作表面方程编程的集成电路。 操作表面方程可以将工作点定义为工作电压，工作频率和漏电流的函数。 可以通过将表面方程拟合到用于多个测试集成电路的工作电压和工作频率对漏电流的数据来产生操作表面方程。 在给定工作频率下的集成电路的工作电压可以通过工作表面方程和融合到器件中的漏电流值来确定。

公开(公告)号：US09672310B1

公开(公告)日：2017-06-06

申请号：US14795013

申请日：2015-07-09

Applicant: Apple Inc.

Inventor： Antonietta Oliva ,  John G. Dorsey ,  Keith Cox ,  Norman J. Rohrer ,  Sribalan Santhanam ,  Sung Wook Kang ,  Mohamed H. Abu-Rama ,  Ashish R. Jain

IPC: G06F17/00 ,  G06F17/50 ,  G01R31/28

CPC classification number: G01R31/2894 ,  G01R31/2856 ,  G01R31/2875 ,  G01R31/2879

Abstract: In an embodiment, the amount of supply voltage guardband to prevent incorrect operation due to aging effects may be modeled using an IC-specific age model generated early in the product life cycle of the IC. For example, high temperature operating life (HTOL) testing may be performed at multiple temperatures and/or voltages to develop the IC-specific age model. The IC-specific age model may be more accurate then the calculations used to develop guardband voltage as discussed previously, which rely on the aging of a single transistor. The IC-specific age model may be used along with monitoring of the aging effects during operation of the IC to predict an amount of increased guardband voltage that is currently desirable to apply to the IC. The predicted amount may vary from about zero when the IC is new to the full amount of guardband voltage when the IC is nearing end of life.

公开(公告)号：US09368416B2

公开(公告)日：2016-06-14

申请号：US13868540

申请日：2013-04-23

Applicant: Apple Inc.

Inventor： Preminder Singh ,  Date Jan Willem Noorlag ,  Sung Wook Kang

IPC: G01N37/00 ,  H01L21/66

CPC classification number: H01L22/20 ,  H01L22/14

Abstract: A binning process uses curve fitting to create and assign one or more bins based on testing data of operating voltage versus leakage current for test integrated circuits. Each bin is created by assigning an initial operating voltage to the bin and fitting a curve to the testing data population. An equation is generated describing the fitted curve. Integrated circuits are binned by measuring the leakage current at a selected operating voltage and testing the integrated circuit at one or more operating voltages determined based on the fitted curves. The integrated circuits are assigned a maximum operating voltage that corresponds to the lowest tested operating voltage at which the integrated circuit passes the test.

Abstract translation: 合并过程使用曲线拟合来创建和分配一个或多个基于测试集成电路的工作电压与泄漏电流的测试数据。 每个仓是通过将初始工作电压分配给仓并将曲线拟合到测试数据群来创建的。 生成描述拟合曲线的方程式。 集成电路通过测量所选工作电压下的漏电流并在基于拟合曲线确定的一个或多个工作电压下测试集成电路进行分组。 分配集成电路的最大工作电压对应于集成电路通过测试的最低测试工作电压。

公开(公告)号：US09291670B2

公开(公告)日：2016-03-22

申请号：US14168177

申请日：2014-01-30

Applicant: Apple Inc.

Inventor： Preminder Singh ,  Sung Wook Kang

IPC: H01L25/00 ,  G01R31/30 ,  G06F1/32 ,  G01R31/28 ,  H01L21/66

CPC classification number: G01R31/3004 ,  G01R31/2879 ,  G06F1/324 ,  H01L22/34

Abstract: A device includes an integrated circuit programmed with an operating surface equation. The operating surface equation may define an operating point as a function of operating voltage, operating frequency, and leakage current. The operating surface equation may be generated by fitting a surface equation to data for operating voltage and operating frequency versus leakage current for a plurality of test integrated circuits. An operating voltage of the integrated circuit at a given operating frequency may be determined by the operating surface equation and a leakage current value fused into the device.

Abstract translation: 一种器件包括用操作表面方程编程的集成电路。 操作表面方程可以将工作点定义为工作电压，工作频率和漏电流的函数。 可以通过将表面方程拟合到用于多个测试集成电路的工作电压和工作频率对漏电流的数据来产生操作表面方程。 在给定工作频率下的集成电路的工作电压可以通过工作表面方程和融合到器件中的漏电流值来确定。