公开(公告)号：US20200026345A1

公开(公告)日：2020-01-23

申请号：US16039842

申请日：2018-07-19

Applicant: Apple Inc.

Inventor： Jay B. Fletcher ,  Karthik Manickam ,  Bo Yang ,  Vincent R. von Kaenel ,  Shawn Searles ,  Hubert Attah ,  Nir Dahan ,  Olivier Girard

IPC: G06F1/32 ,  G01R31/28

Abstract: A voltage regulator circuit included in a computer system may generate a voltage level on a power supply signal using a source power supply signal and based initial values of one or more operation parameters derived from wafer-level test data. One or more operation characteristics of the voltage regulator circuit may be sampled, by a measurement circuit, at multiple time points to generated measurement data. A control circuit may adapt operation of the voltage regulator circuit based on the measurement data.

公开(公告)号：US10891884B1

公开(公告)日：2021-01-12

申请号：US16281996

申请日：2019-02-21

Applicant: Apple Inc.

Inventor： Bo Yang ,  Xiang Lu ,  Andrew J. Copperhall ,  Henry C. Jen ,  Karthik Manickam ,  Sagar Nataraj ,  Shriram Vijayakumar ,  Derek K. Shaeffer

IPC: G09G3/00 ,  G09G3/32 ,  G01R31/3185 ,  G01R31/317 ,  G01R31/58

Abstract: Design-for-test (DFT) architectures, and methods of testing an array of chips, which may be identical, are described. In an embodiment, a comparison circuit includes a plurality of comparators to compare scan-data out (SDO) data streams with an expected data stream and transmit a compared data stream that is indicated of whether or not an error exists in any of the SDO data streams.

公开(公告)号：US11714480B2

公开(公告)日：2023-08-01

申请号：US17499723

申请日：2021-10-12

Applicant: Apple Inc.

Inventor： Jay B. Fletcher ,  Karthik Manickam ,  Bo Yang ,  Vincent R. von Kaenel ,  Shawn Searles ,  Hubert Attah ,  Nir Dahan ,  Olivier Girard

IPC: G06F1/32 ,  G06F1/3296 ,  G01R31/28 ,  G06F1/3206

CPC classification number: G06F1/3296 ,  G01R31/2851 ,  G06F1/3206

Abstract: A voltage regulator circuit included in a computer system may generate a voltage level on a power supply signal using a source power supply signal and based initial values of one or more operation parameters derived from wafer-level test data. One or more operation characteristics of the voltage regulator circuit may be sampled, by a measurement circuit, at multiple time points to generated measurement data. A control circuit may adapt operation of the voltage regulator circuit based on the measurement data.

公开(公告)号：US20220107680A1

公开(公告)日：2022-04-07

申请号：US17499723

申请日：2021-10-12

Applicant: Apple Inc.

Inventor： Jay B. Fletcher ,  Karthik Manickam ,  Bo Yang ,  Vincent R. von Kaenel ,  Shawn Searles ,  Hubert Attah ,  Nir Dahan ,  Olivier Girard

IPC: G06F1/3296 ,  G01R31/28 ,  G06F1/3206

Abstract: A voltage regulator circuit included in a computer system may generate a voltage level on a power supply signal using a source power supply signal and based initial values of one or more operation parameters derived from wafer-level test data. One or more operation characteristics of the voltage regulator circuit may be sampled, by a measurement circuit, at multiple time points to generated measurement data. A control circuit may adapt operation of the voltage regulator circuit based on the measurement data.

公开(公告)号：US11144110B2

公开(公告)日：2021-10-12

申请号：US16039842

申请日：2018-07-19

Applicant: Apple Inc.

Inventor： Jay B. Fletcher ,  Karthik Manickam ,  Bo Yang ,  Vincent R. von Kaenel ,  Shawn Searles ,  Hubert Attah ,  Nir Dahan ,  Olivier Girard

IPC: G06F1/32 ,  G06F1/3296 ,  G01R31/28 ,  G06F1/3206

Abstract: A voltage regulator circuit included in a computer system may generate a voltage level on a power supply signal using a source power supply signal and based initial values of one or more operation parameters derived from wafer-level test data. One or more operation characteristics of the voltage regulator circuit may be sampled, by a measurement circuit, at multiple time points to generated measurement data. A control circuit may adapt operation of the voltage regulator circuit based on the measurement data.