公开(公告)号：US12126171B1

公开(公告)日：2024-10-22

申请号：US17116487

申请日：2020-12-09

Applicant: Amazon Technologies, Inc.

Inventor： Nayana Teja Chiluvuri ,  Chang Hwa Rob Yang ,  Xunwei Yu ,  Kenneth Lawrence Staton ,  Cameron Dean Whitehouse ,  Matthew L. Chaboud ,  Sajesh Kumar Saran ,  Pushkaraksha Gejji ,  Krzysztof Marcin Walczak

IPC: H02J13/00 ,  G06Q50/06 ,  H02J3/14

CPC classification number: H02J3/14 ,  G06Q50/06 ,  H02J13/00017

Abstract: Described is an apparatus to concurrently measure multiple input voltages at a high sampling data rate, such as at least two mega-samples per second. The apparatus may include a plurality of voltage data acquisition components that concurrently sample different input voltages and produce respective voltage data samples. Each of the plurality of voltage data acquisition components may be directly coupled to a field programmable gate array that receives the voltage data samples, packetizes those voltage data samples, and provide the packetized voltage data samples to a system on chip.