公开(公告)号：US20180067535A1

公开(公告)日：2018-03-08

申请号：US15258816

申请日：2016-09-07

申请人： Advanced Micro Devices, Inc. ,  ATI Technologies ULC

发明人： Stephen V. Kosonocky ,  Thomas Burd ,  Adam Clark ,  Larry D. Hewitt ,  John Vincent Faricelli ,  John P. Petry

IPC分类号： G06F1/32 ,  G01R31/28

CPC分类号： G06F1/3209 ,  G01R31/2856 ,  G01R31/2874 ,  G06F1/3206 ,  G06F1/3234 ,  G06F11/008 ,  G06F11/3409

摘要： A system and method for managing operating modes within a semiconductor chip for optimal power and performance while meeting a reliability target are described. A semiconductor chip includes a functional unit and a corresponding reliability monitor. The functional unit provides actual usage values to the reliability monitor. The reliability monitor determines expected usage values based on a reliability target and the age of the semiconductor chip. The reliability monitor compares the actual usage values and the expected usage values. The result of this comparison is used to increase or decrease current operational parameters.

公开(公告)号：US10120430B2

公开(公告)日：2018-11-06

申请号：US15258816

申请日：2016-09-07

申请人： Advanced Micro Devices, Inc. ,  ATI Technologies ULC

发明人： Stephen V. Kosonocky ,  Thomas Burd ,  Adam Clark ,  Larry D. Hewitt ,  John Vincent Faricelli ,  John P. Petry

IPC分类号： G06F1/32 ,  G01R31/28 ,  G06F11/00 ,  G06F11/34

摘要： A system and method for managing operating modes within a semiconductor chip for optimal power and performance while meeting a reliability target are described. A semiconductor chip includes a functional unit and a corresponding reliability monitor. The functional unit provides actual usage values to the reliability monitor. The reliability monitor determines expected usage values based on a reliability target and the age of the semiconductor chip. The reliability monitor compares the actual usage values and the expected usage values. The result of this comparison is used to increase or decrease current operational parameters.